User Manual
Table Of Contents
- Introduction TO QPHY-DDR3
- Signals measured
- DDR3 MEASUREMENT PREPARation
- Basic Functionality
- Using Qualiphy DDR3
- QualiPHY Compliance Test Platform
- QPHY-DDR3 Test Configurations
- 1) Clock tests DDR3-1333 (1 Probe)
- 2) CKdiff-DQse-DQSdiff 1333 Write Burst (3 Probes)
- 3) CKdiff-DQse-DQSdiff 1333 Read Burst (3 Probes)
- 4) Eye Diagram (3 Probes Debug)
- 5) Eye Diagram with CS Enabled (4 Probes Debug)
- 6) CKDiff-DQse-DQS-ADD/CTRLse (4 Probes Debug)
- 7) CKdiff-DQse-DQSp-DQsn (4 probes test, each DQS signal probed single ended)
- 8) CKp-CKn-DQse-DQSdiff (4 probe test, each CK signal is probed single ended)
- 9) Vref tests
- D1) Demo of All Tests
- QPHY-DDR3 Variables
- QPHY-DDR3 Limit Sets
- QPHY-DDR3 Tests
- Clock Tests
- tCK(avg), Average Clock Period
- tCK(abs), Absolute Clock Period
- tCH(avg), Average High Pulse Width
- tCL(avg), Average Low Pulse Width
- tCH(abs), Absolute High Pulse Width
- tCL(abs), Absolute Low Pulse Width
- tJIT(duty), Half Period Jitter
- tJIT(per), Clock Period Jitter
- tJIT(cc), Cycle to Cycle Period Jitter
- tERR(n per), Cumulative Error
- Eye Diagram
- Electrical Tests
- Timing Tests
- Four Probe tests measurements using ADDR/CTL
- Clock Tests
QPHY-DDR3 Software Opti on
917717 Rev C 33
CAS Write Latency
Allows the user to specify the CAS Write Latency (CWL) used to define tCK(avg) limits (see tables 61 to
64 in JEDEC Standard).
Speed Bin
Allows the user to specify the Speed Bin used to define tCK(avg) limits (see tables 61 to 64 in JEDEC
Standard).