User's Manual
Table Of Contents
- Title page
 - Table of Contents
 - General Safety Summary
 - Preface
 - Getting Started
 - Operating Basics
 - Reference
- Reference
 - Menu Structures
 - The Setup Menu Screen
 - The Graphical Waveform Editor
 - The Pattern Editor
 - Quick Editing
 - The Table Editor
 - The Equation Editor
 - The Sequence Editor
 - The APPL Menu
 - The UTILITY Window
- External Keyboards
 - Setting General Purpose Knob Direction
 - Formatting a Floppy Disk
 - Displaying Disk Usage
 - Screen Display Enable/Disable
 - Focused Color
 - Displaying Instrument Status
 - Internal Clock (Date and Time)
 - Resetting the Instrument
 - Connecting to a GPIB Network
 - Ethernet Networking
 - Hardcopy
 - Calibration and Diagnostics
 - Upgrading the System Software
 
 - Capturing Waveforms
 - Waveform Programming Language
 - Command Descriptions
 - Programming Examples
 - File Conversion
 - File Management
 - FG Mode
 - Waveform Mixing Mode
 - Synchronous Operation Mode (AWG710B only)
 
 - Appendices
- Appendix A: Specifications (AWG710B)
 - Appendix A: Specifications (AWG710)
 - Appendix B: Performance Verification (AWG710B)
- Conventions
 - Self Tests
 - Performance Tests
 - Operating Mode Tests
 - Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
 - Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
 - Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
 - Pulse Response Tests (Normal Out), (except option 02)
 - Trigger Input Tests
 - Event Input and Enhanced Mode Tests
 - External Clock Input and VCO Out Output Tests
 - VCO OUT Output Frequency and 10 MHz Reference Input Tests
 - Marker Output Tests
 - Synchronous Operation Tests
 
 - Appendix B: Performance Verification (AWG710)
- Conventions
 - Self Tests
 - Performance Tests
 - Operating Mode Tests
 - Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
 - Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
 - Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
 - Pulse Response Tests (Normal Out), (except option 02)
 - Trigger Input Tests
 - Event Input and Enhanced Mode Tests
 - 1/4 Clock Frequency and 10 MHz Reference Input Tests
 - Marker Output Tests
 
 - Appendix C: Inspection and Cleaning
 - Appendix D: Sample Waveforms
 - Appendix E: File Transfer Interface Outline
 - Appendix F: Miscellaneous
 - Appendix G: Sequence File Text Format
 
 - Index
 

Appendix A: Specifications (AWG710B)
A-18 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Table A-14: Event Input 
Characteristics Description
Connector 9–pin, D type on the rear panel
Number of events 7 bits
Input signal 7 event bits and Strobe
Threshold TTL level
Maximum input 0 V to + 5 V (DC + peak AC)
Impedance 1 kΩ, pull–up to +3.3 V
Enhanced mode
Minimum pulse width 320 clocks + 10 ns
Event hold off time (The time interval between the last event input point and the next acceptable event input point)
≤ 896 clocks + 20 ns 
Delay to analog out, Typical
(Jump timing: ASYNC) (Output: Norm, Filter: Through)
Strobe: On 1691.5 clocks + 10 ns
Strobe: Off 1947.5 clocks + 6 ns
Event input to strobe input
Setup time 192 clocks + 10 ns
Hold time 192 clocks + 10 ns
Table A-15: 10 MHz reference clock input
Characteristics Description
Input voltage range 0.2 V
p–p
 to 3.0 V
p–p
 (into a 50 Ω load, AC coupling)
Maximum ±10 V
Impedance 50 Ω, AC coupling
Frequency range 10 MHz ±0.1 MHz
Connector Rear panel BNC connector
Table A-16: External clock input
Characteristics Description
Connector Rear panel SMA connector
Impedance 50 Ω, AC coupling
Required input voltage range swing 0.4 V
p–p
 to 2 V
p-p
 into a 50 Ω load
Required duty cycle 50 ±5 %










