Datasheet

Datasheet
Capture el
usive glitches – the first time – with Digital Real-Time (DRT) sampling
technolog
y.
Quickly Debug and Characterize Signals with DRT
Sampling Technology
Characterize a w ide range of signal types on up to four channels
simultaneously w ith the TPS2000B Series Digital Real-Time (DRT)
sampling technology. This acquisition technology makes it possible to
capture h
igh-frequency events, such as glitches and edge anomalies, that
eludes other oscilloscopes in its class, so that you can be sure to get an
accurate view of your signal.
Easily Analyze and Document Your Measurement
Results
Quickly reveal signal interference, crosstalk, and the effects of vibration
with frequency domain analysis using the TPS2000B Series Fast Fourier
Tr ansform (FFT) feature. Then, easily document your measurement results
with the
integrated CompactFlash
®
mass storage.
To capture, save, and analyze your measurement results on your PC,
the incl
uded OpenChoice
®
PC software can be used. Every TPS20 00B
Speed documentation and analysis of measurements results with OpenChoice
®
software
and integrated CompactFlash
®
mass storage.
Series also ships with a free copy of the special Tektronix Edition of
National Instru m ent’s LabVIEW Signa lExpre ss™ software for basic
instrument control, data logging, and analysis. The optional Professional
Edition of SignalExpre ss offers over 200 built-in functions that provide
additional signal processing, advanced analysis, sweeping, limit testing,
and user-defined step capabilities.
SignalExpress supports the range of Tektronix bench instruments*
3
,
enabling you to connect your entire test bench. You can then access the
feature-rich tools p acked into each instru
ment from one intuitive software
interface. This allows yo u to automate complex measurements requiring
multiple instrum ents, log d ata for an extended period of time, time-corre late
data fro m multiple instruments, and ea sily capture and analyze your results,
all from your PC. Only Tektronix offers a connected test be nch of intelligent
instruments to simplify and sp eed debug of your complex design.
*
3
To see
the full range of Tektronix instruments supported by the Tektronix Edition of NI LabVIEW
SignalE
xpress, visit www.tektronix.com/signalexpress.
4 www.tektronix.com