Datasheet

Mixed Domain Oscilloscopes — MDO4000 Series
Search – RS-232 decode showing results from a Wave Inspector
®
search for data value
”n”. Wave Inspector controls provide unprecedented efficiency in viewing and navigating
waveform data.
Search
Finding your event of interest in a long waveform record can be time
consuming without the right search tools. With today's record lengths
pushing beyond a million data points, locating your event can mean scrolling
through thousands of screens of signal activity.
The MDO4000 Series offers the industry's most comprehensive search and
waveform navigation with its innovative Wave Inspector
®
controls. These
controls speed panning and zooming through you r record. With a unique
force-feedback syste m, you can move from one end of your reco rd to the
other in just seconds. User marks allow you to mark a ny location that you
may want
to reference later for further investigation. Or, automatically
search your record for criteria you d e fine. Wave Inspector will instantly
search your entire record, including analog, digital, and serial bus data.
Along the way it will automatically mark every occurrence of your defined
event so you can quickly move between each occurrence.
Analyze –W
aveform histogram of a falling edge showing the distribution of edge position
(jitter) o
ver time. Included are numeric measurements made on the waveform histogram
data. A com
prehensive set of integrated analysis tools speeds verification of your design's
performan
ce.
Analyze
Verifying that your prototype's performance matches simu lations and m eets
the project's design goals requires analyzing its behavior. Tasks c an range
from simple checks of rise times and pulse widths to sophisticated power
loss analysis and investigation of noise sources.
The M DO4000 Series offers a comprehensive set of integrated analysis
tools including waveform- and scre en-based cursors, 44 automated
measurements, and advanced waveform math including arbitra ry equation
editing
, w aveform histograms, FFT analysis, and trend plots for visually
determining how a measurement is changing over time. S pecialized
application support for serial bus analysis, power supply design, limit and
mask testing, and video d esign and development is also available.
For extende d analysis, National Instrument's LabVIEW SignalExpress™
Tektronix Edition provides over 200 built-in functions including time and
frequency domain ana lysis, data logging, and customizable r eports.
www.tektronix.com 9