Datasheet

TEK.COM
9SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
Highest Performance
Parameter Analyzer
Keithley's 4200A-SCS is a modular,
customizable, and fully-integrated
parameter analyzer that provides
synchronized insight into current-
voltage (I-V), capacitance-voltage
(C-V), and ultra-fast pulsed I-V
electrical characterization. Its optional
4200A-CVIV Multi-switch module
enables effortless switching between
I-V and C-V measurements without
re-cabling or lifting prober needles.
Offering up to 2X faster characterization
insight, the 4200A-SCS accelerates
testing of complex devices for materials
research, semiconductor device design,
process development or production.
Keithley also offers the industry's
most complete line of picoammeters,
electrometers and nanovoltmeters
for highly sensitive voltage, current
and resistance measurements for
nanoscience applications.
Resources
Advances in Electrical Measurements
for Nanotechnology eBook – Learn
why sensitive electrical measurement
tools are essential for nanoscience
research. Understand how these
tools provide the data needed to
understand the electrical properties of
new materials fully and the electrical
performance of new nanoelectronic
devices and components.
Electrical Characterization of Carbon
Nanotube Transistors (CNT FETs)
with the Model 4200-SCS Parameter
Analyzer App Note – Learn how to
perform IV characterization on carbon
nanotube FETs.
Source-Measure Units-
(SMU) Instruments
Source-measure units or SMUs
are ideal instruments for making
nanoscopic material and device
measurements. They are a smart
alternative to separate power
supplies and digital multimeters
(DMMs). Keithley SourceMeter®SMU
instruments combine a power supply,
true current source, 6.5-digit DMM,
arbitrary waveform generator, V or I
pulse generator with measurement,
electronic load and trigger controller
in one instrument with a convenient
DMM-like user interface.
A source and measure unit can rapidly
switch from outputting a specified
voltage and accurately measuring
the resulting current, to the other
way around. When materials such as
carbon nanotubes (CNTs) or graphene
are in a high impedance state, the
SMU can source voltage and measure
current quickly and accurately. When
the material is in a low impedance
state, the SMU can quickly reconfigure
to source current and measure
voltage. Furthermore, the SMU has a
current compliance function that can
automatically limit the DC current level
to prevent damage to the material or
device under test (DUT).
From 3000V to 10nV and 50A pulse to
1fA, Keithley's family of SourceMeter
SMU instruments offers the broadest
measurement range available. Each is
fully programmable and provides higher
precision, resolution and flexibility for
materials research, semiconductor
devices (transistor, BJT, diode, power
MOSFET, power semi, LED), electronic
circuits, and more.