Datasheet

Digital Phosphor Oscilloscopes MSO3000 Series, DPO3000 Series
Search–I
2
C decode showing results from a Wave Inspector search for Address value
50. Wave Inspector controls provide unprecedented efciency in viewing and navigating
waveform data.
Search
Finding your event of interest in a long waveform record can be time
consuming without the right search tools. W ith today’s record lengths
pushing beyond a million data points, locating your event can mean scrolling
through thousand s of screens of signal activity.
The MSO/DPO3000 Series offers the industry’s most comprehensive
search and waveform navigation with its innovative Wave Inspector
®
controls. These c ontrols speed panning and zooming through your record.
With a unique force-feedback system, you can move from one end of your
record to
the other in just seconds. User marks allow you to mark any
location that you may want to reference later for further investigation. Or,
automatically sea rch your record for criteria you dene. Wave Inspector
will instantly sea rch your entire record, including analog, digital, and serial
bus data. Along the way it will automatically ma rk every occurrence of your
dened event s o you can quickly move between events.
Analyze FF
T analysis of a pulsed signal. A comprehensive set of integrated analysis
tools speed
sverication of your design’s performance.
Analyze
Verifying that your prototype’s performance matches simulations and meets
the project’s design goals requ ires analyzing its behavior. Tasks can range
from simple checks of rise times and pulse widths to sophisticated power
loss analysis and investigation of noise sou rces.
The MSO/DPO3000 Series offers a comprehensive set of integrated
analysis to ols including waveform- and screen-based cursors, 29
automated measurements, advanced wa v eform math including arbitrary
equation e
diting, FFT a nalysis, and trend plots for visually determining
how a measurement is ch anging over time. Specialized application
support for serial bus analysis, power supply design, and video design and
development is also available.
For extende d analysis, National Instrument’s LabVIEW SignalExpress™
Tektronix Edition provides over 200 built-in functions including time and
frequency domain analysis, limit testing, data logging, and customizable
reports.
www.tektronix.com 3