User Manual CSA8000B Communications Signal Analyzer TDS8000B Digital Sampling Oscilloscope 071-1099-03 This document applies to firmware version 2.0 and above. www.tektronix.
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WARRANTY Tektronix warrants that the products that it manufactures and sells will be free from defects in materials and workmanship for a period of one (1) year from the date of shipment. If this product proves defective during its warranty period, Tektronix, at its option, will either repair the defective product without charge for parts and labor, or provide a replacement in exchange for the defective product.
Table of Contents General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ix xi About This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Related Manuals and Online Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table of Contents Operating Basics Operational Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Documentation Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . System Overview Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2--1 2--2 2--4 Functional Model Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Process Overview Map . . . . . . . . . . . . . . . . . . . .
Table of Contents Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3--39 Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Keys to Using . . . . . . . . . . . . . . . . .
Table of Contents iv Operations on Math Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . To Use Math Waveforms . . . . . . . . . . . . . . . . . . . . .
Table of Contents Using Waveform Databases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . What’s Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . What’s Excluded? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . .
Table of Contents List of Figures Figure 1--1: Compartments for sampling modules . . . . . . . . . . . . . . . Figure 1--2: Maximum inputs in three configurations . . . . . . . . . . . . Figure 1--3: Locations of peripheral connectors on rear panel . . . . . Figure 1--4: Line fuse and power cord connector locations, rear panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Figure 1--5: On/Standby switch location . . . . . . . . . . . . . . . . . . . . . . .
Table of Contents Figure 3--12: Triggered versus untriggered displays . . . . . . . . . . . . . Figure 3--13: Trigger inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Figure 3--14: Holdoff adjustment can prevent false triggers . . . . . . . Figure 3--15: Trigger to End Of Record Time (EORT) . . . . . . . . . . . Figure 3--16: Display elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Figure 3--17: Horizontal position includes time to Horizontal Reference . . . .
Table of Contents List of Tables viii Table 1--1: Additional accessory connection information . . . . . . . . . Table 1--2: Line fuses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Table 1--3: Standard accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Table 1--4: Optional accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1--13 1--13 1--41 1--42 Table 3--1: Application-based triggering . . . . . . . . . . . . . . . . . . . . . .
General Safety Summary Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it. To avoid potential hazards, use this product only as specified. Only qualified personnel should perform service procedures. While using this product, you may need to access other parts of the system. Read the General Safety Summary in other system manuals for warnings and cautions related to operating the system.
General Safety Summary Provide Proper Ventilation. Refer to the manual’s installation instructions for details on installing the product so it has proper ventilation. Symbols and Terms Terms in this Manual. These terms may appear in this manual: WARNING. Warning statements identify conditions or practices that could result in injury or loss of life. CAUTION. Caution statements identify conditions or practices that could result in damage to this product or other property. Terms on the Product.
Preface This is the user manual for the CSA8000B Communications Signal Analyzer and TDS8000B Digital Sampling Oscilloscope.
Preface Related Manuals and Online Documents This manual is part of a document set of standard-accessory manuals and online documentation; this manual mainly focuses on installation and background needed to use the product features. See the following list for other documents supporting instrument operation and service. (Manual part numbers are listed in Table 1--3 on page 1--41.
Preface Contacting Tektronix Phone 1-800-833-9200* Address Tektronix, Inc. Department or name (if known) 14200 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA Web site www.tektronix.com Sales support 1-800-833-9200, select option 1* Service support 1-800-833-9200, select option 2* Technical support Email: techsupport@tektronix.com 1-800-833-9200, select option 3* 6:00 a.m. - 5:00 p.m. Pacific time * This phone number is toll free in North America.
Preface xiv CSA8000B & TDS8000B User Manual
Product Description This chapter describes your instrument, which is either the CSA8000B Communications Signal Analyzer or the TDS8000B Digital Sampling Oscilloscope, and its options. Following this description are four sections: H Check the Package Contents, on page 1--7, shows you how to verify that you have received all of the parts of your instrument.
Product Description front-panel controls with the mouse and keyboard or with the touch screen. The installed Windows operating system (MS Windows 98 or MS Windows 2000) is dependent on the purchase date or product upgrade status. Key features include: H industry-leading waveform acquisition and measurement rate, with Sample, Envelope, and Average acquisition modes. H support for up to six sampling modules (two large and four small modules) for a maximum configuration of ten inputs.
Product Description FibreChannel signals, and 1, 2, and 10 Gigabit FibreChannel signals as well as 2.5 Gb/s Infiniband signals. NOTE. Support for conformance testing rates is determined by the specific modules that are installed. H high precision time base with two modes of operation, locked and short-term jitter-optimized H negligible long-term jitter degradation (<0.1 ppm), which substantially improves the ability to view signals that are delayed far from the trigger point without distortion.
Product Description product software becomes necessary. See Software Installation on page 1--15. New versions of the software may become available at our web site. See Contacting Tektronix on page xiii in Preface. Firmware Upgrade Tektronix may offer firmware upgrade kits for the instrument. Contact your Tektronix service representative for more information (see Contacting Tektronix on page xiii).
Product Description H 80C07 -- 155/622/2488 Mb/s amplified optical module. Clock Recovery for all rates added with option CR1. This module has been superseded by the 80C07B. H 80C07B -- 155/622/1063/1250/2125/2488/2500 Mb/s amplified optical module. (The module is limited to five receivers configured at the time of order.) Clock Recovery for all rates (plus 2666 Mb/s) added with option CR1. H 80C08 -- 9.953/10.31 Gb/s Multi-rate amplified optical module. Clock Recovery (9.953 and 10.
Product Description H 80E04 -- A dual-channel, 20 GHz TDR sampling module. The TDR step generator provides 35 ps reflected step risetime. Voltage polarity can be reversed on either step to provide true differential TDR. H 80E06 -- A single-channel, 70+ GHz sampling module. This model provides very high performance bandwidth for general-purpose characterization of high speed devices and circuits. Other Modules.
Check the Package Contents Verify that you have received all of the parts of your instrument. You should verify that you have: H the main instrument. H all the standard accessories for the main instrument. Standard accessories are listed in Table 1--3 on page 1--41. H the correct power cords for your geographical area.
Check the Package Contents 1- 8 CSA8000B & TDS8000B User Manual
Installation This section covers installation of the instrument, addressing the following topics: H Check the Environment Requirements on page 1--9 H Install the Sampling Modules on page 1--10 H Connect the Peripherals on page 1--12 H Power On the Instrument on page 1--13 H Powering Off the Instrument on page 1--15 H Brightness and Contrast Adjustment (Gamma) on page 1--15 H Back Up User Files on page 1--15 The basic operating software is already installed on the hard disk.
Installation Operating Requirements Rackmount Requirements Specifications in Appendix A list the operating requirements for the instrument. Power source and temperature, humidity, and altitude are listed. If this instrument is rackmounted, see the TDS8000 & CSA8000 Rackmount Instructions for additional site considerations or operating requirements. This document ships with the Option 1R (rackmount kit). Install the Sampling Modules CAUTION.
Installation Large-module compartments (2) Small-module compartments (4) Connect ESD wrist strap here Figure 1- 1: Compartments for sampling modules Maximum Configuration You can install up to two large sampling modules and four small modules for a total of 10 inputs. Of these 10 inputs, only eight inputs can be active at one time (see Figure 1--2, top two configurations). Also, note that installing a single large module in either compartment disables the first small-module compartment (see note).
Installation Connect the Peripherals The peripheral connections are mostly the same as those you would make on a personal computer. The connection points are shown in Figure 1--3. See Table 1--1 on page 1--13 for additional connection information. WARNING. Before installing peripheral accessories to connectors (mouse, keyboard, etc.), power down the instrument. See Powering Off the Instrument on page 1--15. Monitor............. Printer...................... RS-232................. Network.................
Installation Table 1- 1: Additional accessory connection information Item Description Monitor If you use a non-standard monitor, you may need to change the the Windows display settings to achieve the proper resolution for your monitor. Printer Connect the printer to the EPP (enhanced parallel port) connector directly. If your printer has a DB-25 connector, use the adapter cable that came with your printer to connect to the EPP connector.
Installation CAUTION. Connect the keyboard, mouse, and other accessories before applying power to the product. Connecting the accessories after powering on the instrument can damage the accessories. Two exceptions are the USB keyboard and mouse that ships with the instrument. Both can be plugged or unplugged without first turning power off. 2. Connect the keyboard and mouse, observing the caution above.
Installation Powering Off the Instrument The instrument has a built-in soft power-down function that safely powers down the instrument when you push the On/Standby button. You do not need to close the UI application or Windows before using the On/Standby button. To completely remove power to the instrument, first soft power-down the instrument using the On/Standby button, and then set the power switch on the rear panel to off.
Installation Description Software Release Notes There are two sets of CDs that ship with this instrument: H OS Rebuild CD. This 2-disk set contains the operating system for the instrument. This CD set, which can be used to rebuild the instrument hard drive, includes the Windows operating system installation. H Product Software CD. The product software, or UI application, complements the hardware controls of the front panel, allowing complete set up of all instrument features.
Incoming Inspection This section contains instructions for performing an incoming inspection of this instrument. Performance of an incoming inspection is not required to put the instrument in service. These instructions verify that the instrument is operating correctly after shipment, but do not check product specifications. An incoming inspection includes the following parts: H Perform the Diagnostics on page 1--18 runs the internal diagnostics.
Incoming Inspection H One SMA 10X attenuator, such as Tektronix part number 015-1003-00. H One or more (quantity to match number of electrical channels to compensate) 50 Ω terminators, such as Tektronix part number 015-1022-01 H One 50 Ω terminator cap, such as Tektronix part number 011-0049-02 H One 80E00-series electrical sampling modules installed as outlined in its User manual.
Incoming Inspection 2. Select a diagnostics suite: a. In the dialog box, click the Subsystem Level tab. b. Select the all the entries by clicking the first entry Control Proc and dragging down to select the rest. All entries should be highlighted as shown above. c. In the Run box, leave Loop and Halt on Failure unchecked. 3. Verify that the diagnostic suite passes: a. Click the Run button to execute the diagnostics. b. The diagnostics may take several minutes to complete.
Incoming Inspection Perform the Compensation This procedure uses internal routines to verify that the instrument compensates properly. Equipment required For sampling modules: H 50 Ω terminations on all electrical module channels (Tektronix part number 015-1022-xx). H Dust covers on all optical module channels. The sampling modules ship from Tektronix with the proper terminations and dust covers installed.
Incoming Inspection b. Wait until the Status for all items you wish to compensate changes from Warm Up to Pass, Fail, or Comp Req’d. c. Under Select Action, click the Compensate option button. d. From the top pulldown list, choose All (default selection) to select the main instrument and all its modules as targets to compensate. e. Click the Execute button to begin the compensation. f.
Incoming Inspection STOP. These procedures verify functions; that is, they verify that the instrument features operate. They do not verify that they operate within limits; therefore, do not interpret any quantities cited (such as “about five horizontal divisions”) as limits. STOP. DO NOT make changes to the front-panel settings that are not called out in the procedures. Each verification procedure will require you to set the instrument to default settings before verifying functions.
Incoming Inspection CSA8000/TDS8000 SMA cable from DC calibration output to 80E00 C3 input Figure 1- 7: Hookup for electrical functional tests 4. Set the DC CALIBRATOR OUTPUT: a. Push the Vertical MENU front-panel button. This displays the Vert Setup dialog box. NOTE. When an optical module is installed, the optical setup dialog box displays by default. Click the Basic button to display the basic dialog box. b. Enter a level of 200 mV in the DC CAL box. c.
Incoming Inspection 6. Verify that the channel is operational: Confirm that the following statements are true: H The vertical scale readout for the channel under test shows a setting of 100 mV, and a DC level is at about 2 divisions above center screen. H The front-panel vertical POSITION knob (for the channel you are testing) moves the DC level up and down the screen when rotated. Return the DC level to 2 divisions above center screen before continuing.
Incoming Inspection c. Set the Vertical Scale, Vertical Offset, and DC Calibration Output to the levels shown in the first row of the table that follows. d. In Measurement readout on screen, verify that the Mean measurement for the channel under test falls within the limits given in the table. e. Repeat steps c and d for each row in the table. Vertical Scale (mV/div) Vertical Offset (mV) DC CAL Output (mV) Limits Minimum (mV) Maximum (mV) 100 - 1000.0 - 1000.0 - 1009.0 - 991.0 100 0.
Incoming Inspection 3. Select the channel to test: Push the channel button for the channel you want to test. The button lights amber and the channel displays. See Figure 1--9. Channel buttons Figure 1- 9: Channel button location 4. Verify that the channel is operational: Confirm that the following statements are true.
Incoming Inspection NOTE. If the position knob was set to 0.000, you can confirm this in the Vertical menu (use Basic button in the dialog box). Baseline Vertical offset Control bar Vertical offset setting Figure 1- 10: Optical channel verification 5. Verify that the channel acquires in all acquisition modes: Push the front-panel button Acquisition MENU to display the Acq Setup dialog box.
Incoming Inspection 7. Test all channels: Repeat steps 3 through 5 until all optical input channels are verified. Verify the Time Bases Work After verifying the channels, you can now verify that the time bases function. This verification is done using a front-panel signal. Equipment required One SMA cable, such as Tektronix part number 174-1427-00. One 10x SMA attenuator, such as Tektronix 015-1003-00. One electrical (80E00-series) sampling module. Prerequisites None 1.
Incoming Inspection d. Push the channel button for the channel you connected to in step 2. See Figure 1--12 on page 1--29. The button lights and the channel display comes on. e. Turn the Vertical SCALE knob to set the vertical scale to 20 mV/div. The channel scale readout is displayed in the Control bar at the bottom of the graticule. Channel buttons Figure 1- 12: Channel button location 4. Set the time base: Set the Horizontal SCALE to 1 s/div.
Incoming Inspection NOTE. At some temperatures, there may be extraneous data points after the first half cycle when viewing the front-panel Internal Clock output (as is done in this step). This behavior may also occur when viewing multiple cycles in TDR mode. In both cases, this behavior is normal.
Incoming Inspection 6. Set up the Mag1 time base: a. Push the Horizontal View MAG1 button on the front panel. The Mag1 time base view will display under the Main time base view. b. Set the Horizontal SCALE to 1 s/div. The horizontal scale readout is displayed in the Control bar at the bottom of the graticule and is now reading out the scale of the Mag1 time base view. 7. Verify that the Mag1 time base operates: Confirm the following statements.
Incoming Inspection 8. Verify that the Mag2 time base operates: a. Push the Mag1 button to remove the display of the Mag1 time base. b. Perform steps 6 and 7, but use the Mag2 button instead of the Mag1. Perform Gated Trigger Test This test verifies that the Gated Trigger (GT Option) is functional. This test is done using a front-panel signal and a rear-panel TTL connection.
Incoming Inspection 3. Hook up the signal source: Connect the SMA cable from the Internal Clock output through a 10x attenuator to 80E00 sampling module input channel 3 as shown in Figure 1--16. Connect BNC cable to External Gate input at rear panel. Rear panel CSA8000/TDS8000 TRIGGER GATE (TTL) SMA cable from INTERNAL CLOCK output to 80E00 C3 input 10x attenuator BNC cable attached to TRIGGER GATE (TTL) on the rear panel. Figure 1- 16: Hookup for the gated trigger tests 4. Set up the instrument: a.
Incoming Inspection 7. Push the Horizontal MENU button, the Mode in All Timebases must be set to Lock to Int. 10 MHz. 8. Verify that Triggering occurs: Verify signal is triggered with waveform on-screen. See Figure 1--17 on page 1--34. Triggered signal indicator Internal clock signal Control bar Vertical scale setting Horizontal scale setting Figure 1- 17: Signal triggered 9. Disable trigger: Install 50 Ω terminator cap to the end of the cable that is attached to the rear-panel gated trigger BNC.
Incoming Inspection Untriggered signal indicator Control bar Vertical scale setting Horizontal scale setting Figure 1- 18: Signal not triggered (signal frozen) CSA8000B & TDS8000B User Manual 1- 35
Incoming Inspection Untriggered signal indicator Control bar Vertical scale setting Horizontal scale setting Figure 1- 19: Signal not triggered (no signal) 11. Verify that the Gated Trigger function is enabled: Disconnect 50 Ω terminator cap from the end of the cable. Verify signal is triggered (gate enabled) with waveform on-screen. See Figure 1--20 on page 1--37.
Incoming Inspection Triggered signal indicator Internal clock signal Control bar Vertical scale setting Horizontal scale setting Figure 1- 20: Signal triggered 12. Disconnect the test hook up.
Incoming Inspection Perform the Hardware and Operating System Tests (Windows 98 Only) NOTE. The procedures in this section only apply to instruments using the MS Windows 98 operating system. Instruments using the MS Windows 2000 operating system do not include the QAPlus/Win software. These procedures verify the instrument hardware functions. A diagnostics program called QAPlus/Win is used to make the verifications. No equipment is required.
Incoming Inspection Checking the Cooling Fan Operation Checking the Hardware and Operating System Power on the instrument and visually inspect the left side panel of the instrument to verify that all six cooling fans are rotating. Equipment required None Prerequisites The instrument must be powered on and running. To perform a minimal check of the hardware and Windows 98 operating system of this instrument, perform this procedure to run QA+Win32 diagnostics from the Windows 98 Start menu.
Incoming Inspection NOTE. A test button is not highlighted until you select it. As you select the button for each test (tool tip appears when you point to the button), a highlight box appears around the button. When you click Start, the button blinks until the test is complete and the highlight box changes color to indicate the test is complete. Follow any instructions appearing on the screen. 7. Check test results in scrollable results listing in the Test Results window of the QAPlus test window.
Accessories and Options This section lists the standard and optional accessories, as well as the product options available for the instrument at the time this manual was published. Accessories Standard Table 1--3 lists the standard accessories that ship with the instrument. NOTE. The standard accessories that ship with any instrument modules are not listed here. Each instrument module ships in its own package. Consult the user documentation of the module for a list of accessories.
Accessories and Options Optional The following accessories are orderable for use with the instrument at the time this manual was originally published. Consult a current Tektronix catalog for additions, changes, and details. Table 1- 4: Optional accessories Item 1- 42 Part number H 80A02 EOS/ESD Protection module 80A02 H Sampling Module Extender (1 meter) 012-1568-00 H Sampling Module Extender (2 meter) 012-1569-00 H 3.5 Male to 3.
Accessories and Options Options The following options can be ordered for the instrument: H Option 1K: Cart H Option 1R: Rack Mount Kit (includes hardware and instructions for converting to rackmount configuration) H Option GT: Gated Trigger option.
Accessories and Options 1- 44 CSA8000B & TDS8000B User Manual
Operational Maps This chapter acquaints you with how the instrument functions and operates. It consists of several maps that describe the system, its operation, and its documentation: H Documentation Map, on page 2--2, lists the documentation that supports the instrument. H System Overview Maps on page 2--4, describe the high-level operating blocks and operating cycle of the instrument.
Documentation Map This instrument ships with documents individually tailored to address different aspects or parts of the product features and interface. The table below cross references each document to the instrument features and interfaces it supports. To read about... Refer to these documents: Description Standard accessories or packing list Graphical packing list The graphical packing list is one of the items you should find when you open the instrument box.
Documentation Map To read about... Refer to these documents: Description In Depth Operation and UI Help Online Help System Access online help from the instrument for context-sensitive information on virtually all controls and elements on screen. Online help includes a setup guide of procedures for applying all instrument functions. See Accessing Online Help on page 3-- 167. Online Programmers Guide GPIB Commands ? Access this online guide from the instrument from its Help menu.
System Overview Maps The instrument and its sampling modules comprise a highly capable waveform acquisition, test, and measurement system. The following model provides background information on its operation, which, in turn, may provide you insight on how the instrument can be used. Functional Model Map Modular Sampling Specialization Input modules CH1..
System Overview Maps H Digital Signal Acquisition System. Acquires a waveform record from each signal you apply to each channel using the following subsystems: H Acquisition System. Sets vertical offset for the vertical acquisition window for each channel. Performs the actual A/D conversion and storing of digitized samples. Also performs post A/D sample-based corrections to compensate for non-linearities of various analog circuits. H Trigger System.
System Overview Maps Process Overview Map Process overview Process block description Idling... Yes Stop condition? Reset Abort Power On1 No 1. The instrument starts in the idle state; it enters this state upon power up, upon receiving most control setting changes, or upon finishing acquisition tasks. 2.
User Interface Map - Complete Control and Display Menu Bar: Access to data I/O, printing, online help system, and set-up functions Status Bar.
Front Panel Map - Quick Access to Most Often Used Features Turn knob to adjust most control fields in setup dialogs. Press the Select button to switch among fields. Press the Fine button to toggle between normal and fine adjustment. Press to start and stop acquisition or clear all channel waveforms at once. Page 3-- 26. Press a Menu button to quickly access the setup dialog for its control group for more detailed set up.
Display Map - Single Graticule View Drag cursors to measure waveforms on screen. Drag the Horizontal Reference to move the point around which horizontal scaling expands and contracts the waveforms. Drag the Waveform Icon vertically to position waveform. Right click on a waveform or its icon for handy access to often used setup controls and properties. Drag ground reference icon to add offset to a waveform. Drag across the waveform area to zoom the boxed waveform segment to full screen width.
Display Map - Multiple Views Drag the markers to enclose the portion of waveform to appear in Mag 2 View. Drag the markers to enclose the portion of waveform to appear in Mag 1 View. MAIN View 2- 10 Mag View Mag View Drag the border between graticules to vertically size Main, Mag1, and Mag2 Views.
Front Panel I/O Map Floppy disk drive accessible from Windows 98 Compartments for large modules, up to two channels INTERNAL CLOCK OUTPUT DC CALIBRATION OUTPUT Compartments for small modules, up to eight channels ANTISTATIC CONNECTION for wrist strap, 1 MΩ to ground EXTERNAL 10 MHZ REFERENCE INPUT TRIGGER PRESCALE TRIGGER DIRECT input input CSA8000B & TDS8000B User Manual TRIGGER PROBE POWER 2- 11
Rear Panel I/O Map Removable hard disk drive to provide individual environment for each user or to secure data, press to release CDROM drive accessible from Windows, press to open USB connector for mouse or keyboard and mouse PS-2 connectors for mouse and keyboard Upper VGA port to connect a second monitor for side-by-side display Lower VGA port to connect a monitor for oscilloscope display Parallel port (Centronics) to connect printer or other device GPIB port to connect to controller RJ-45 connector t
Overview This chapter describes how the many features of the instrument operate. Please note the following points on using this chapter: H Each section in this chapter provides background information needed to operate the instrument effectively as well as the higher-level procedures for accessing and using the features. These procedures emphasize using the front panel when possible. H Lower-level, detailed usage procedures are in the online help system.
Overview 3- 2 CSA8000B & TDS8000B User Manual
Acquiring Waveforms Before you can display, measure, or analyze a waveform, you must acquire it from a signal. This instrument comes equipped with the features you need for capturing your waveforms.
Acquiring Waveforms Signal Connection and Scaling This section presents an overview of the instrument features related to setting up the input signal for digitizing and acquisition. It addresses the following topics: H Where to find information for installing sampling modules and connecting input signals H How to turn on channels and adjust their vertical scale, position, and offset H How to set the horizontal scale, position, and record length of the Main (time base) View NOTE.
Acquiring Waveforms H Set horizontal scale to control the time duration of the horizontal acquisition window to capture as much as you want of the input signal(s). To control where in the input signal (data stream) that the horizontal acquisition window acquires, you set horizontal position to delay the window relative to a trigger to capture the waveform portion you want. To increase or decrease the resolution between sample points, change the record length.
Acquiring Waveforms CAUTION. Install sampling modules before applying power and before connecting them to the signals you want to test. See your sampling-module user manual for instructions. CAUTION. Sampling modules are inherently vulnerable to static damage. Always observe static-safe procedures and cautions as outlined in your sampling-module user manual. Coupling Concerns. Electrical sampling modules provide only straight-DC coupling to their sampling circuits, with no protection.
Acquiring Waveforms Clipped H Set horizontal scale, position, and resolution (record length) so that the acquired waveform record includes the signal attributes of interest with good sampling density on the waveform. The settings you make define the horizontal acquisition window, described in Horizontal Acquisition Window Considerations on page 3--17. (“Good sample density” might be at least five samples on each waveform transition when acquiring for timing measurements.
Acquiring Waveforms Flexible Control Access. The product provides multiple methods for adjusting acquisition controls. This manual focuses on basic setup through the front panel, and the use of the User Interface (UI) Application displayed full screen. See the display maps, beginning on page 2--9, for UI alternatives to controlling vertical and horizontal setup. The online help system also documents the UI.
Acquiring Waveforms Overview To set the signal input (cont.) Select the input 3. signal channel Related control elements and resources Push the channel button (turns amber) to assign the waveform buttons, 1 - 8, to operate on channel waveforms. Push a waveform button to select the signal channel (it displays). A waveform button lights when its channel is on: H When on but not selected, its button is lighted green. H When on and selected, its button is lighted amber. Hint.
Acquiring Waveforms Overview To set the signal input (cont.) Set the 5. horizontal acquisition window Related control elements and resources Push the View Main button to make sure the main time base view is selected. Use horizontal knobs to scale and position the waveform on screen and to set sample resolution. Scaled horizontally Positioned horizontally The Resolution knob sets the record length. (See discussion on page 3-- 19.) Push Set to 50% if required to stabilize display. Continue with 6.
Acquiring Waveforms To Autoset the Instrument Overview With an input signal connected, use the procedure that follows to autoset based on the characteristics of the input signal. Autoset operates on the selected channel only. To autoset Prerequisites 1. 2. Execute 3. Control elements and resources The instrument must be installed with sampling modules in place. Signals must be connected to channels. A triggering source must be provided.
Acquiring Waveforms Overview To autoset (cont.) Define 4. Control elements and resources Click Define Autoset in the Utilities menu to display the Autoset properties dialog box. To change the autoset criteria, select from: H Edge to setup the default autoset for instrument to acquire the waveform data such that the center 20% of the record contains a rising edge. H Period to setup the default autoset for instrument to acquire the waveform data such that the record contains 2 or 3 periods.
Acquiring Waveforms NOTE. Autoset sets the vertical position to zero and adjusts the vertical offset to center the signal in the display. If a standard mask is active for the selected waveform, Autoset adjusts the selected waveform record to match the mask, if possible. Autoset adjusts the vertical scale and offset, horizontal scale, position, and reference parameters as required for the mask standard.
Acquiring Waveforms Autoset Considerations. Autoset acquires samples from the input signal and attempts to take the following actions based on the input data: H Evaluate the amplitude range of the input signals and offset of the vertical acquisition window to acquire the signal without clipping. H Set the trigger level to the approximate midlevel of the trigger signal being applied (either an external trigger or a clock-recovery trigger).
Acquiring Waveforms The vertical scale and position controls do not affect the vertical acquisition window, rather they adjust the display system to display the waveform as follows: H The vertical scale (per division) setting determines the portion of the vertical acquisition window that appears in the graticule, allowing you to scale it to contain all of the window or only part.
Acquiring Waveforms NOTE. Amplitude-related automatic measurements (for example, peak-to-peak and RMS) will be accurate for vertical windows like those shown in Figure 3--2 a and b on page 3--15 because neither waveform is clipped (that is, both waveforms are acquired). But if the signal amplitude were to extend outside the vertical acquisition window, the data acquired becomes clipped. Clipped data causes inaccurate results if used in amplitude-related automatic measurements.
Acquiring Waveforms Vertical window = 1 V peak-to-peak (fixed by sampling module used) Offset +300 mV (Near waveform top level) C1 Offset 0.0 V (At waveform ground reference) C1 Offset - 300 mV (Waveform bottom level) C1 Acquisition window shifts positive to capture overshoot Acquisition window shifts negative to capture preshoot Figure 3- 3: Varying offset positions vertical acquisition window on waveform amplitude NOTE.
Acquiring Waveforms applied to all channels in parallel. (See Independent vs. Shared Window on page 3--20.) These parameters are: H The external trigger signal that you input and set the trigger system to recognize determines the point relative to the input waveform that triggers the instrument. H The horizontal position you set determines the horizontal delay from the trigger point to the first sample point in the acquisition window.
Acquiring Waveforms Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution. These parameters all relate to each other and specify the horizontal acquisition window. Because the horizontal acquisition window must fit in the 10 horizontal division display, for most cases, you just set the duration of the horizontal acquisition window (10 divs x the scale setting) as described in (1) below.
Acquiring Waveforms NOTE. Resolution and the equivalent elements, sample interval and sample rate (see equation 3 above), are not settable directly, but are derived. You can, however, check the resolution at anytime in the resolution readout (push the Horizontal Menu button). Also note, that the Resolution knob actually adjusts the record length to increase sample density (detail). Independent vs. Shared Window.
Acquiring Waveforms Setting Acquisition Controls This section overviews the instrument acquisition features—those that start and stop acquisitions and those that control how the instrument processes the data as it is acquired (just sampled, or averaged or enveloped). Special features, keys to using, and operation controls are covered.
Acquiring Waveforms What’s Excluded? Envelope acquisition mode can not be used with FrameScan acquisitions; you must use Sample or Average modes. Keys to Using The key points that follow describe operating considerations for setting up the acquisition system so the waveforms acquired best fit your requirements. Acquisition Modes. Consider the mode you want to use to acquire data: H Sample - the instrument does no post-processing of acquired samples.
Acquiring Waveforms Global Controls. Like the horizontal controls, the acquisition controls apply to all active channels. For example, channel 1 cannot acquire in Sample mode while channel 2 acquires in Envelope mode; you cannot stop channel 8 from acquiring (if turned on) while other channels continue to acquire.
Acquiring Waveforms To Set Acquisition Modes Overview Use the procedure that follows to set the data-acquisition mode and specify acquisition start and stop methods. For more detailed information, display online help when performing the procedure. To set acquisitions modes Prerequisites 1. Control elements and resources Instrument must be installed with sampling modules in place before powering on the instrument. Instrument must be powered up, with horizontal and vertical controls setup.
Acquiring Waveforms Overview To set acquisitions modes (cont.) Set the Stop 4. mode and action Control elements and resources Under Stop After, click one of the following options: H Run/Stop Button Only H Condition 5. If you selected Condition, choose a condition from the drop-down list, such as Number of Acquisitions or Mask Total Hits, to stop on. If the condition requires a count (count box is enabled), enter a count. 6. Select a Stop After action from the drop-down list box.
Acquiring Waveforms To Start and Stop Acquisition Overview Use the procedure that follows to start and stop acquisition. To start and stop acquisition Prerequisites 1. Control elements and resources Instrument must be installed with sampling modules in place before powering on the instrument. Instrument must be powered up, with horizontal and vertical controls set up. Triggering should also be set up. See sampling-module user manuals for sampling module installation.
Acquiring Waveforms Acquisition Control Background This section contains background information on the data sampling and acquisition process that can help you more effectively setup the acquisition window of each channel. This section: Acquisition Hardware H describes the acquisition hardware. H defines the sampling process, sampling modes, and the waveform record. H describes the acquisition cycle in Normal and FrameScan modes.
Acquiring Waveforms repeated trigger events, also provides the digitized signal data from which the instrument assembles the waveform record (see Figure 3--9 on page 3--29). The signal parts within the vertical range of the sampler are digitized. See Figure 3--8. +0.5 V 0V Input signal Sampled points +0.5 V 0V 0V - 0.5 V Digital values 0V - 0.
Acquiring Waveforms Sample interval First sampled and digitized point Waveform record acquired over many acquisitions, 1 sample per acquisition Recurring trigger events from trigger signal Record length Horizontal delay Figure 3- 9: The waveform record and its defining parameters As Figure 3--9 shows, the instrument acquires points in order from left to right, with each point from a separate trigger event, and delayed from that event by: horizontal delay + (sample interval x (sample number -- 1)) When
Acquiring Waveforms FrameScan Acquisitions This instrument can modify its normal acquisition process to help you analyze pattern-dependent failures in high bit-rate communications signals. Why Use? FrameScan acquisitions allow detailed display and analysis of individual, complete waveforms or of the bit sequences leading up to a failure. This ability to identify the specific patterns that caused the failures makes using FrameScan mode superior to traditional methods.
Acquiring Waveforms What’s Excluded? The instrument must be in Average or Sample acquisition modes; FrameScan excludes Envelope acquisition mode. Keys to Using The key points that follow describe FrameScan mode operating behavior and provide background to help you to use this feature. Determine Start Bit and Scan Bits.
Acquiring Waveforms for the frame, or until acquisition stops due to a specific test condition, such as the failure of a mask test. The resulting horizontally skewed FrameScan acquisitions display successive individual bits acquired in increasing time order. FrameScan acquisitions can continue through an entire frame of data if needed to help you to uncover faulty bit sequences leading up to pattern-dependent failures.
Acquiring Waveforms To Acquire in FrameScan Mode Overview Use the procedure that follows to set up the instrument to acquire in FrameScan mode. To acquire in FrameScan mode Prerequisites 1. Control elements and resources The instrument must have an appropriate sampling module in place before powering on the instrument. Instrument must be powered up. 2. The signal to be scanned must be input to a channel and an appropriate external framing signal must be applied to the trigger input. 3.
Acquiring Waveforms Overview To acquire in FrameScan mode (cont.) Set the bit rate 8. Set the horizontal scale so one acquisition record is equal to one bit. Use one of the two methods that follow: H H Set the starting 9. horizontal position Automatic: If your signal to be scanned matches a communications standard, select it from the Comm Standard list. Choosing a standard sets the bit rate and start bit; otherwise, if you know the bit rate, you can set the bit rate manually using the Bit Rate box.
Acquiring Waveforms Overview To acquire in FrameScan mode (cont.) Control elements and resources Set a display 12. If you want to display the frame-scanned acquisition as mode an eye diagram, set one of the following display modes: H Select Infinite Persistence or Variable Persistence in the Display Setup dialog box (from the application menu bar, select Setup, and then select Display).
Acquiring Waveforms To Catch a Bit Error Overview FrameScan Acquisition, when coupled with mask testing, provides the tool you need to capture a defective bit and examine the pattern leading up to it. To catch a bit error Prerequisites 1. 2. 3. Control elements and resources The instrument should be set up per the previous procedure. Pause the acquisition system (push the Run/Stop button on the front-panel).
Acquiring Waveforms Overview To catch a bit error (cont.) Set conditional 6. acquisition and start testing 7. From the application menu bar, select Setup, and then select Acquire. 8. In the Condition pulldown list, select Mask Total Hits and set a count of one in the count box. These settings will stop acquisition on a violation of any of the masked areas on screen. See below. For more 9.
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Triggering To properly acquire waveforms — to sample a signal and assemble it into a waveform record — you need to set up the instrument trigger conditions. This section provides an overview of the instrument trigger features and their use.
Triggering Gated Triggering. For instruments equipped with Option GT, the system allows triggering to be enabled and disabled (gated) based on a TTL signal at a rear panel input. See To Use Gated Trigger on page 3--50. Keys to Using The key points that follow describe operating considerations for setting up to trigger on your waveforms. Triggering Process. When a trigger event occurs, the instrument acquires a sample in the process of building a waveform record.
Triggering Positive-going edge Negative-going edge Trigger level can be adjusted vertically. Trigger slope can be positive or negative, with trigger point occurring on the slope specified. Figure 3- 11: Slope and level define the trigger event Trigger Modes. The trigger modes control the behavior of the instrument when not triggered: H Normal mode sets the instrument to acquire a waveform only when triggered.
Triggering Trigger Sources. The trigger source provides the signal that the trigger system monitors. The source can be: H the internal clock of the instrument (TDR clock rate), with user-selectable clock frequencies. The Internal Clock Out connector supplies a replica of the internal clock at the instrument front panel. See Figure 3--13 on page 3--42.
Triggering Use a trigger source that is synchronized with the signal you are sampling and displaying. Selection of your trigger source depends on your application, as shown in Table 3--1. Table 3- 1: Application-based triggering Application Source to use Communications (optical) serial NRZ data signals Set source to Clock Recovery, set the clock-recovery type, and use an optical sampling module equipped with a clock-recovery option supporting the specific data rate of the serial optical signal.
Triggering Trigger Source Connectors. External triggers can be connected to either the Trigger DIRECT or Trigger PRESCALE connectors on the front panel (see Figure 3--13): H Signals connected to the PRESCALE connector are divided by eight and then fed to the trigger circuits. H Signals connected to the DIRECT connector are fed directly to the trigger circuitry. The signal is DC coupled and can be up to 3.0 GHz.
Triggering Gated Trigger Connector (Option GT equipped). You can attach a BNC cable to the External Gate input at rear panel (TTL connection). Two conditions must be satisfied to get a stable display of waveform data: H The channel and trigger must be otherwise triggerable without the trigger gate. H The gating signal must be at a TTL high; the triggering system enabled and the instrument will acquire.
Triggering recognize when the next trigger conditions are satisfied and cannot generate the next trigger event. When instrument is triggering on undesired events (Figure 3--14, top waveform), you adjust holdoff to obtain stable triggering. Holdoff Holdoff Holdoff Trigger level Indicates trigger points Holdoff Holdoff Holdoff Holdoff Trigger level At the longer holdoff time for the top waveform, triggering occurs at valid, but undesired, trigger events.
Triggering For example: EORT = 6 s + (1--0.1(.5) x 1 s/div x 10 div + 0 = 6 s + 5 = 11 s, when: Horizontal position = 6 s Horizontal Ref = 50% Time/Division = 1 s/div Channel Deskew = 0 (set to minimum) In this example, because 11 s is greater than 5 s, the current control settings determine the minimum usable holdoff the instrument can use. EORT Trigger point Time to EORT Horizontal position Horizontal delay (19 ns min.
Triggering To Trigger Overview Use the procedure that follows when setting up the instrument to trigger acquisitions. To trigger Prerequisites 1. Control elements and resources The instrument must be installed with sampling modules in place. Acquisition system should be set to Run, and the vertical and horizontal controls should be set appropriately for the signal to be acquired. See Sampling Module User Manuals for sampling module installation. See page 3-- 24 of this manual for acquisition setup.
Triggering Overview To trigger (cont.) Verify 6. triggering Other trigger 7. parameters For more 8. information Control elements and resources When the instrument is triggered, the word Triggered is displayed in the toolbar on screen. You can use also the trigger lights to verify triggering status as follows: H READY lights when the instrument acquisition system is running but the trigger system is not receiving valid trigger events. This includes when auto triggering in absence of a trigger.
Triggering To Use Gated Trigger Overview Use the procedure that follows when setting up the instrument to use the gated trigger. Gated trigger is only available with Option GT installed. To use gated trigger Prerequisites 1. 2. The Acquisition system should be set to Run, and the vertical and horizontal controls should be set appropriately for the signal to be acquired. Trigger on your input signal. Use the procedure To Trigger on page 3-- 48 as needed.
Triggering Overview To use gated trigger (Cont.) Enable gated 4. triggering Control elements and resources In the Enhanced Triggering options section of the dialog box, check Gated Trigger. Check to enable Complete set up 5. For more 6. information Attach an appropriate TTL-gating signal to the TRIGGER GATE (TTL) rear-panel connector. Operation is as follows: H Triggering system will be disabled when the gating signal is a TTL low, and instrument will not acquire.
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Displaying Waveforms To make use of the waveforms you acquire, you will often want to display them. This instrument includes a flexible, customizable display that you can control to examine and analyze acquired waveforms. This section presents an overview of display operation in the topics Using the Waveform Display and Customizing the Display.
Displaying Waveforms (2) Graticule (5) Horizontal reference (6) Preview mode indicator (3) Upper limit of graticule (selected waveform) (7) Main view (1) Waveform display (3) Lower limit of graticule (selected waveform) (7) Mag1 view (4) Horizontal scale readout (selected waveform) Figure 3- 16: Display elements (1) Waveform display: the area where the waveforms appear. The display comprises the time bases and graticules, the waveforms, masks, histograms, and readouts.
Displaying Waveforms view is a representation of a signal on an associated time base—the Main time base with the Main view, which is always displayed, or one of the two Mag views, each with its own time base and graticule. The display of the Mag views can be turned on or off. You can display up to three views on screen (Main plus Mag1 and Mag2) at the same time. Touchscreen (not shown): a feature that lets you touch controls on screen to operate the instrument.
Displaying Waveforms Keys to Using The key points that follow describe operating considerations for setting up the instrument time base views so that they best support your data-analysis tasks. Waveform Display. In general, the method of displaying a waveform is to define the waveform, and then turn it on. Table 3--2 summarizes this process as it applies to the different waveforms.
Displaying Waveforms Table 3- 3: Operations performed based on the selected waveform Control function Waveform supports? Operating notes Ch Ref Math Vertical Scale Yes Yes Yes Vertical Position Yes Yes Yes Vertical Offset Yes No No Horizontal Scale Yes No No Horizontal Position Yes No No Horizontal Record Length Yes No No Automatic Source Selection for Automatic Measurements Yes Yes Yes Measurements, if selected from Measurements toolbar, use the selected waveform as the m
Displaying Waveforms and then adjust it using the Horizontal Scale, Resolution, and Position knobs. Only channel waveforms can have their horizontal parameters set directly. Table 3--3 shows how horizontal operations relate to the waveform types; the key points to remember follow: H As Table 3--3 shows, horizontal operations affect all channel waveforms, but in the selected view only.
Displaying Waveforms Mag1 and Mag2 are Magnifying Timebases. The Mag1 and Mag2 time bases are so named because they cannot be set to a more coarse (slower) horizontal scale than that of the Main. When set to a more fine (faster) horizontal scale, they can be thought of as magnifying a segment of the Main time base. In short: H each Mag time base scale sets the size of an aperture on the Main time base. H each Mag time base position setting locates the aperture within the Main time base.
Displaying Waveforms Horizontal Units. You can specify the time values in seconds, bits or distance from the Horizontal Setup dialog box. When you select Distance as the timebase units, the timebase scale and position controls and the readouts use (appear with) distance units. You can select from meters, feet, or inches as your distance unit. The timing measurement results remain as seconds.
Displaying Waveforms Table 3- 4: Equivalent mouse and touchscreen operations Operations Mouse Stylus or finger Select waveforms Left click object on screen Touch object on screen Position cursors on screen, draw a zoom box Left click and drag Touch and drag Display a pop up menu for a channel or a readout Right click object Touch and hold (don’t move stylus) Type a value in a list box Click the keyboard icon to pop up the virtual keyboard; click to type in the value you want (or use the periph
Displaying Waveforms To Display Waveforms in the Main Time Base View Overview Use the procedure that follows to become familiar with the display adjustments you can make. To control the Main view Prerequisites 1. 2. 3. Set the vertical 4. display parameters Related control elements and resources The instrument must be installed with sampling modules in place. The acquisition system should be set to run continuously.
Displaying Waveforms Overview To control the Main view (cont.) Set the horizon- 6. tal display parameters Related control elements and resources Push the View Main button to make sure the Main time base view is selected. Use the Horizontal knobs to scale and position the waveform on screen and to set sample resolution. Scaled Horizontally Positioned Horizontally The Resolution knob sets the record length. (See discussion on page 3-- 19.) Push the Set to 50% button if required to stabilize display.
Displaying Waveforms Overview To control the Main view (cont.) Related control elements and resources Explore the 10. The next procedure describes how to set up and Mag time base control the Mag time bases. controls See To Display Waveforms in a Mag View on page 3-- 64. End of Procedure To Display Waveforms in a Mag View Overview Use the procedure that follows to become familiar with the display adjustments you can make when using the Mag 1 and Mag 2 time base views.
Displaying Waveforms Overview To control a Mag view (cont.) Set horizontal 3. display parameters Related control elements and resources Use the Horizontal knobs (see right) to achieve a good display of the waveform in the Mag time base. Time base settings for Channel waveforms will be adjusted as you use the controls; the controls will be inoperable if you have a reference or a math waveform selected.
Displaying Waveforms Customizing the Display Why Use? What’s Special? Keys to Using Use the display customizing features this instrument provides to present the display elements—color, graticule style, waveform representation, and so on—according to your preferences. Color grading. You can select color grading of a waveform so that its data color or intensity reflects the frequency of occurrence of the data.
Displaying Waveforms Normal and Persistence Displays. Use display persistence to control how waveform data ages: H Normal style displays waveforms without persistence: each new waveform record replaces the previously acquired record for a channel. You can choose to display normal waveforms as vectors, which displays lines between the record points, or dots (vectors off) which displays the record points only. You can also choose an interpolation mode. See Interpolation below.
Displaying Waveforms To Set Display Styles Overview Use the procedure that follows to become familiar with the display styles you can set. To set display styles Prerequisites 1. Related control elements and resources The instrument must be powered up, with any waveform you want to display on screen. See page 3-- 24 for acquisition setup and page 3-- 48 for trigger setup. Access the 2. Display setup dialog box From the application menu bar, select Setup, and then select Display. See right.
Displaying Waveforms Overview To set display styles (cont.) Select a 6. persistence Mode Related control elements and resources From the the Setup Display dialog box (see right), choose: H H Infinite Persistence to make data persist until you change some control (such as scale factor) or explicitly clear the data. Waveform displays accumulate data as new waveform records acquire, resulting in a build up of data in all time slots. Variable Persistence to make data persist for a specified time.
Displaying Waveforms Overview Customizations you can make (cont.) Change wave- 3. form color or label 4. Right click on the waveform or its icon. See right. Type a new name in the Waveform Label box. The instrument will use the new label to mark the selected waveform in the graticule area. 6. Choose a color from the Color pulldown list. Click OK to dismiss the dialog. 8. Waveform Icon Choose Properties from the menu that pops up. 5. Color grade a 7.
Displaying Waveforms Overview Customizations you can make (cont.) Related control elements and resources Reduce a wave- 9. Right click on the waveform or its icon. See right. form to its icon 10. Choose Show from the menu that pops up to toggle the waveform between shown (checked) and hidden (unchecked). Tip. Hiding a waveform is useful when you temporarily want to remove the display of a waveform without turning it off.
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Measuring Waveforms To assist you in analyzing the waveforms you acquire, the instrument comes equipped with cursors and automatic measurements. This section describes these tools and how you use them: H Taking Automatic Measurements, on page 3--74, describes how you can set up the instrument to automatically measure and display a variety of waveform parameters. See Figure 3--18. H Taking Cursor Measurements, on page 3--85, describes using cursors to make amplitude and time measurements on waveforms.
Measuring Waveforms Taking Automatic Measurements Why Use? What’s Measured? What’s Special? This powerful and flexible tool provides automatic extraction of various parameters from the waveforms that this instrument acquires. Automated measurements quickly give you immediate, continuously updating, measurement results for a rich selection of waveform parameters, such as risetime or extinction ratio. You also can display statistics on how the measurement results vary as they continuously update.
Measuring Waveforms Annotations indicate the waveform region determining measurement Figure 3- 19: Measurement annotations on a waveform Use Databases as Sources. If you define the source you want to measure as a database in the Meas Setup dialog box, you can use the database of that waveform as source. The measurement you select operates on the accumulated waveform data (databases accumulate repetitive instances of a source waveform over time). For example, consider the Max measurement.
Measuring Waveforms What’s Excluded? Keys to Using The following exclusions apply when using automatic measurements: H More than eight measurements at one time are not allowed. H Except for Average Optical Power, all measurements of the category RZ or NRZ must be performed on a waveform database (see Use Databases as Sources on page 3--75). The Average Optical Power measurement cannot use a waveform database as its source.
Measuring Waveforms waveform database. You can measure the waveform instead of its database if you turn off Use Wfm Database in the Meas setup dialog box. H If you assign a database to a waveform already being used as a source for an automatic measurement, it will not automatically measure the waveform database; you must explicitly specify its use by turning on Use Wfm Database in the Meas Setup dialog box. High/Low Tracking.
Measuring Waveforms High (min/max) High (mean) High (mode) Mid reference Low (mode) Low (mean) Low (min/max) Figure 3- 20: High/Low tracking methods H Mean (of Histogram) sets the values statistically. Using a histogram, it selects the mean or average value derived using all values either above or below the midpoint (depending on whether it is defining the high or low reference level). This setting is best for examining eye patterns and optical signals. See Figure 3--20.
Measuring Waveforms Reference Levels Method. You can choose the method that the instrument uses to determine a second group of levels when taking time-related measurements. These levels are the High, Mid, and Low references. For example, the measurement system takes risetime from the waveform-edge segment that transitions from the Low to the High reference levels. The instrument provides the following calculation methods; refer to Figure 3--21 as you read about each method: 1.
Measuring Waveforms The AOP method is the Average Optical Power reference level. This reference level selection is best used when taking the Optical Modulation Amplitude (OMA) measurement on a pulse waveform. (The AOP setting is ignored for NRZ waveforms.) This method is selected by default when measurement type is set to OMA. See the OMA measurement on page B--5. Default Methods.
Measuring Waveforms Overview To take automatic measurements (cont.) Take Automatic 3. measurements Related control elements and resources Select one of the signal (waveform) types and then select a category from the measurement bar. 4. Click the measurement you want in the measurement tool bar. 5. Read the results in the measurements readout. Tip.
Measuring Waveforms Overview To take automatic measurements (cont.) To measure a 8. database 9. Related control elements and resources From the application menu bar, select Setup, and then select Measurement. See right. In the Meas Setup dialog box, make sure the measurement (one of Meas1 through Meas8) is selected. 10. In the Source tab, check the Use Wfm Database option as shown below. Tip.
Measuring Waveforms To Localize a Measurement Overview Use the procedure that follows to set gates on a measurement source, which forces the measurement to be taken over a segment of the waveform (otherwise, the entire waveform feeds the measurement). To gate a measurement Prerequisites 1. Related control elements and resources Set up as from last procedure. See To Take an Automatic Measurement on page 3-- 24 Access the 2.
Measuring Waveforms Overview To gate a measurement (cont.
Measuring Waveforms Taking Cursor Measurements Why Use? What’s Measured? Use cursors to measure amplitude and time quickly and with more accuracy than when using graticule measurements. Because you position cursors wherever you want on the waveform, they are easier to localize to a waveform segment or feature than automatic measurements. Time or amplitude or both.
Measuring Waveforms What Sources Can I Measure? Keys to Using Cursors Cursors can measure channel, reference, and math waveforms, as well as waveform databases. You may set the source of each cursor explicitly in the Cursor Setup dialog box. The key points that follow describe operating considerations for setting up cursors to obtain best measurement results. Cursor Types. The three cursor types are described in Table 3--6 on page 3--85.
Measuring Waveforms cursor. Up to the time you turn cursors on, you can select a waveform on screen to use it as the source for the cursors. H Once cursors are on, selecting a different waveform does not change the source the cursors measure. To change the source while cursors are on, you must change the source in the Cursors Setup dialog box. H Turning cursors off restores the default cursor source assignment so that assignment again tracks the currently selected waveform.
Measuring Waveforms Horizontal Ref = 0% First sampled point Trigger point of cursor source Cursor readout (tn) = Time to first point + Horizontal divs x sec/div Cursor Figure 3- 23: Components determining Time cursor readout values Note that a vertical cursor readout (t1 or t2) includes and varies directly with the time-to-first-point component, which varies directly with the horizontal position set for the time base used by the cursor-source waveform.
Measuring Waveforms To Take a Cursor Measurement Overview Use the procedure that follows to take cursor measurements on waveforms. To take cursor measurements Prerequisites 1. Related control elements and resources At least one waveform must be selected on screen. Or you can set cursor values directly using the procedure referenced at right. See To Set the Cursor Sources on page 3-- 90. Take cursor 2. measurements Press the CURSORS button (see right).
Measuring Waveforms Overview To take cursor measurements (cont.) To reassign cur- 6. sors Related control elements and resources Press the Cursor button repeatedly to toggle through the cursor selections until the cursors are off. Then select a new waveform on screen. Tip. You can set the cursors source(s) directly using the procedure listed at right. See To Set the Cursor Sources on page 3-- 90.
Measuring Waveforms Overview To set the cursor sources (cont.) Select the cur- 4. sor sources Related control elements and resources Click to access sources From the pop-up list (see right) for each of Cursor 1 and Cursor 2, select a source: H To measure a single source, choose the same source for both cursors — Main C1, for example. H To measure two different sources in the same time base, make sure the time bases match — Main C1 and Main C2, for example.
Measuring Waveforms Optimizing Measurement Accuracy Why Use? Compensation The procedures given here will increase the accuracy of the measurements you take. This instrument can compensate itself and the sampling modules installed, optimizing the internal signal path used to acquire the waveforms you measure. Compensation optimizes the capability of the instrument to make accurate measurements based on the ambient temperature. NOTE.
Measuring Waveforms Overview To perform a compensation (cont.
Measuring Waveforms Overview To perform a compensation (cont.) Select the 3. scope of the compensation Related control elements and resources Wait until the Status for all items you want to compensate changes from Warm Up to Comp Req’d or Pass. 4. In the Select Action fields, select Compensate. 5. From the top pulldown list, select the target to compensate. Choose from: H All to select the main instrument and all its modules (default selection). H Mainframe to select only the main instrument.
Measuring Waveforms Overview To perform a compensation (cont.) Save the 7. compensation 8. Related control elements and resources In the Select Action fields, select Save. Click the Execute button to save the new compensation results. The new compensation results will be lost when the instrument is powered down if they are not saved. The Storage destination for the compensation results is limited to the User area. The Factory settings cannot be overwritten. Recalling a 9.
Measuring Waveforms To Deskew Channels When making differential, common-mode, or other measurements, you may need to null out the propagation delay contributed by the input cabling between two or more channels. Use the following procedure to adjust the deskew between channels. NOTE. When deskew is applied between channels within the same sampling module, the time shift is accomplished by making a second waveform acquisition.
Measuring Waveforms Overview To deskew between channels (cont.) Set up the 5. reference channel 6. Deskew the 7. channel Control elements and resources Set up the channel to be used as the reference channel: a Push the channel numbered button under Vertical on the front panel. b Use the Vertical SCALE knob and POSITION knobs to display the waveform edge to be deskewed to fill the screen vertically.
Measuring Waveforms To Perform Dark-Level and User Wavelength Gain Compensations Performing a dark-level compensation maximizes the accuracy of the extinction ratio and other optical automatic measurements you take. Performing a User Wavelength Gain compensation optimizes an optical channel for your custom input signal. NOTE. Dark level compensation performs a subset of the module compensation process. It is designed to be fast so it can be performed frequently, just before measurements are taken.
Measuring Waveforms Overview To perform optical compensations (cont.) Run the dark- 4. level compensation 5. Control elements and resources In Vert Setup dialog box, click the Dark Level button under Compensation. See right. Follow the instructions on screen. Repeat steps 2 and 4 for any additional optical channels you want to compensate. Run the user If you want, you can can compensate an optical channel for wavelength gain a custom input signal: compensation 6.
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Creating Math Waveforms Once you have acquired waveforms or taken measurements on waveforms, the instrument can mathematically combine them to create a waveform that supports your data-analysis task. For example, you can define a math waveform that combines waveforms mathematically (+, --, /, x). You can also integrate a single waveform into an integral math waveform as is shown below.
Creating Math Waveforms Why Use? Create math waveforms to support the analysis of your channel and reference waveforms. By combining and transforming source waveforms and other data into math waveforms, you can derive the data view that your application requires. You can create math waveforms that result from: H mathematical operations on one or several waveforms or measurements: add, subtract, multiply, and divide. H function transforms of waveforms, such as integrating, differentiating, and so on.
Creating Math Waveforms Keys to Using The key points that follow describe considerations for creating math waveforms that best supports your data-analysis tasks. How to Create. You create math waveforms when you create a math expression. You do so by applying numerical constants, math operators, and functions to operands, which can be channel, waveforms, reference waveforms, measurements (scalars), or fixed scalars.
Creating Math Waveforms Source Dependencies. In general, math waveforms that include sources as operands are affected by updates to those sources: H Shifts in amplitude or DC level of input sources that cause the source to clip also clip the waveform data supplied to the math waveform. H Changes to the vertical offset setting for a channel source that clip its data also clip the waveform data supplied to the math waveform.
Creating Math Waveforms := | ( ) := | | := | := C1 | C2 | C3 | C4 | C5 | C6 | C7 | C8 := R1 | R2 | R3 | R4 | R5 | R6 | R7 | R8 := Integrate | Differentiate | Average | Max | Min | Filter | Vmag | Exp | log | ln | sqrt := + | - | / | * := meas1 | meas2 | meas3 | meas4 | meas5 | meas6 | meas7 | meas8 To
Creating Math Waveforms Overview To define a math waveform (cont.) Select a math 3. waveform Related control elements & resources Click the Math Waveform drop-down list in the dialog box and select a one of the eight available math waveforms, M1 through M8. Be sure to click to check the On box, so that the waveform displays. Tip. If the waveform you select already exists, its math expression appears in the dialog box.
Creating Math Waveforms Overview To define a math waveform (cont.) Apply the 6. expression Once you have defined the math expression to your satisfaction, click the Apply button. Then click on the OK button to dismiss the dialog box. See To Use Math Waveforms on page 3-- 109 for more procedures. For more 7. information Click the icon in the the upper-right corner of the Define Math dialog box, and then click any dialog-box control to pop up help on that control. 8.
Creating Math Waveforms You can adjust these controls for the source waveforms and your adjustments will reflect in the math waveform as the sources update. You can also magnify math waveforms using the Mag1 or Mag2 derived time bases. Keys to Using H Independent vertical offset. You cannot adjust the offset for a math waveform; you can adjust the offset of channel waveforms used as sources to a math waveform. H Explicit gating of waveforms.
Creating Math Waveforms To Use Math Waveforms Overview The procedure that follows demonstrates some common operations you can perform on math waveforms: To use math waveforms Prerequisites 1. Related control elements & resources The Math waveform must be defined and displayed. See the reference listed at right. See To Define Math Waveforms on page 3-- 105 Select and dis- 2. play 3. Press the Vertical MATH button.
Creating Math Waveforms Overview Take automatic measurements To use math waveforms (cont.) 5. Press the Vertical MATH button, and use the numbered front-panel button to choose a math waveform from M1 - M8. (See right.) 6. Select one of the signal types, such as Pulse, and then select a measurement category from the measurement bar. 7. Click a measurement button. The instrument automatically takes the measurement on the waveform you selected in step 5. 8.
Creating Math Waveforms Overview Take cursor measurements To use math waveforms (cont.) 9. Related control elements & resources Press the Vertical MATH button, and use the numbered front-panel button to choose a math waveform from M1 - M8. The button will light amber when you have chosen the waveform. (See figure at upper right.) 10. Press the CURSORS button (see figure at lower right).
Creating Math Waveforms 3- 112 CSA8000B & TDS8000B User Manual
Data Input and Output This section describes the input and output capabilities of your instrument. Specifically, it covers: H Saving and Recalling Setups on page 3--113 H Saving and Recalling Waveforms on page 3--120 H Exporting Waveforms and Histograms on page 3--128 H Printing Waveforms on page 3--132.
Data Input and Output What’s Special? Some features of note follow: Commenting. The Save-Setup and the Recall-Setup dialog boxes provide for including and viewing comments with your saved setups. That way, you can store information, readable upon recall, that describes each setup you save and its intended application. Virtual Keyboarding. If you do not have a keyboard connected, you can still enter comments and name setup files.
Data Input and Output Avoiding Setup and Waveform Mismatches. Saved setups may contain settings inappropriate for waveforms currently in your instrument. For example, you might have saved a setup that displayed a fiber channel mask, such as FC531, for testing channel 1. If later you display a gigabit ethernet signal in channel 1 and recall your saved setup, the FC531 mask will display. Avoiding Setup and Sampling Module Mismatches.
Data Input and Output Overview To save your setup Prerequisites 1. Control elements & resources The instrument must have appropriate sampling modules in place before powering on the instrument. 2. Instrument must be powered up. 3. Set up the instrument controls as you want them saved as part of a recallable setup. H See Sampling Module User Manuals for sampling module installation.
Data Input and Output Overview To save your setup (cont.) Name your 6. setup Control elements & resources Name your setup file by either: H accepting the default file name that appears in the File name: text box. H clicking in the File name text box and typing a new name, replacing the default file name. H clicking an existing name in the file list (if any are listed). Data in existing file will be overwritten. Access to virtual keyboard Tip.
Data Input and Output To Recall Your Setup Overview To recall your setup Prerequisites 1. Display the 2. Recall Setup dialog box Name a 3. destination 3- 118 Use the procedure that follows to recall a setup to the instrument. Remember that recalling a setup replaces the existing setup, which is lost. Control elements & resources The instrument should have appropriate sampling modules in place for the setup to be recalled. You must have access to a setup saved by the instrument.
Data Input and Output Overview To recall your setup (cont.) Select your 4. setup Control elements & resources If not selected, select *.stp in the Save as type list box of file to include in the dialog box file listing. (Setup files are always type *.stp). Tip. Only change the type if you want to temporarily see any other types of files in the current directory. Otherwise, leave it set at *.stp. 5. Choose your setup file by either: H Clicking an existing name in the file list.
Data Input and Output Saving and Recalling Waveforms This instrument can save any number of waveforms, limited only by the space you have to store them. Why Use? What’s Special? By saving a waveform, you can recall it at a later time for comparison, evaluation, and documentation. This capability is helpful when you want to: H recall a waveform for further evaluation or comparison with other waveforms. H extend the waveform carrying capacity of the instrument.
Data Input and Output To Save Your Waveform Overview Use the procedure that follows to save a waveform or waveforms to the instrument hard disk, a floppy disk, or third party storage device. To save a waveform Prerequisites 1. 2. The instrument must have appropriate sampling modules in place before powering on the instrument. Instrument must be powered up. Make sure the waveform to be saved exists; that is, your source must be a channel, an active math waveform, or an active reference.
Data Input and Output Overview To save a waveform (cont.) Select a 4. destination Select your 5. waveform(s) to save Control elements & resources Navigate to the directory in which to store your waveform. You can: H Save to a reference: Click to check Reference, and then use the pulldown list to select any reference (R1-R8). You can save to empty references or save over existing references. Skip to step 8 to finish. H Save to a file: Click to check File(s) and continue with step 5 that follows.
Data Input and Output Overview To save a waveform (cont.) Add a comment 7. (optional) Control elements & resources For saves to files or to references, you can enter a useful comment about the each waveform you save. Write each comment such that it explains the purpose of the saved waveform when its waveform file is later accessed (see right). Tip. If you save multiple waveforms, the instrument saves your comment with all the resulting files, so make such a comment pertain to all the waveforms.
Data Input and Output To Recall Your Waveform Use the procedure that follows to recall a waveform to a reference. You can only recall waveforms into references. NOTE. Reference waveforms do not recall because they are already instrument resident. You can copy a reference waveform to another reference: first display the reference to be copied, and then use the Save Waveform procedure to save it to another reference (R1-R8). Overview To recall a waveform Prerequisites 1. Display the Re- 2.
Data Input and Output Overview To recall a waveform (cont.) Name a 3. destination Use the Look in: drop down list and buttons (see right) to navigate to the directory which contains a waveform that you want to recall. Select your 4. waveform If not selected, select *.wfm in the Files of type field to force the dialog-box file listing to only include these types. Use *.wfm for waveforms. Control elements & resources Tip.
Data Input and Output Overview To recall a waveform (cont.) For more 8. information Control elements & resources For more help on recalling waveforms, press the Help button in the dialog box to access contextual online help. See page 3--167 to learn about using online help.
Data Input and Output To Clear References Overview You can clear individual references of data individually or all at once. If a reference is listed as active and you are sure you do not want the data it contains, use the procedure that follows to clear it. You can clear any of the active references R1-R8. To clear a reference Display the 1. Clear References dialog box Select Refs 2. Control elements & resources From the application menu bar, select Edit, and then select Clear References.
Data Input and Output Exporting Waveforms and Histograms This instrument also supports export of a waveform or histogram to a file. The instrument exports the data as comma-separated ASCII text. Why Use? Keys to Using To Export Your Waveform 3- 128 By exporting a waveform or a histogram, you can use it with other analysis tools, such as spreadsheets or math-analysis applications.
Data Input and Output Figure 3- 25: Export dialog box To Export Your Histogram Use the process just described for exporting a waveform on page 3--128, select the Histogram button in the Export dialog box (see Figure 3--25). Also skip selecting a source. The instrument supports a single histogram, so the current histogram is automatically selected. If no histogram is enabled in the Hist Setup dialog box, the Histogram button will be disabled in the Export dialog box.
Data Input and Output Overview To use exported waveforms (cont.) Import the 3. waveform data 4. Control elements & resources In Excel, select Open from the File menu. Use the dialog box that pops up to navigate to the directory containing the file. In the dialog that displays, make the selections as shown right as you navigate through the Text Import Wizard. You must select delimiter as your data type, comma as the delimiter type, and General as your data type. Tip.
Data Input and Output Overview To use exported waveforms (cont.) Specify a 7. line-graph chart From the Chart Wizard, make sure Built In is checked. Then select the either Lines in the Standards Types tab or Smooth lines in the Custom Types tab. (See illustration at right.) Finish the 8. chart Click Next to step through the next two steps accepting the defaults settings at each step. Click the Finish button in step 4. You should have a waveform display similar to that show right.
Data Input and Output Printing Waveforms You can print the display screen, including any waveforms displayed. Before doing so, you must install and set up your printer. To Print Waveforms Overview To print waveforms Prerequisites 1. 2. Access the 3. Print dialog box 3- 132 To print the display and its waveforms, do the following steps: Control elements & resources Waveforms must be displayed on screen. Your printer must be accessible and configured properly. H See Acquiring Waveforms on page 3-- 3.
Data Input and Output Overview To Print Waveforms (cont.) Configure and 4. Print Control elements & resources Configure your print job using the the standard Microsoft Windows Print dialog box that displays. Press the OK button to print your display. Tip. Access the printer instructions or the Windows Help system if you require more information on printing.
Data Input and Output To Print Using Ink-saver Mode Overview To print using ink-saver mode Prerequisites 1. 2. Access the 3. Print dialog box 3- 134 To conserve ink and improve print quality when printing images of waveform displays, you can use Ink-saver mode. Do the following steps: Control elements & resources Waveforms must be displayed on screen. Your Printer must be accessible and configured properly. H See Acquiring Waveforms on page 3-- 3. H See Triggering on page 3-- 39.
Data Input and Output Overview To print using ink-saver mode (cont.) Set Ink-saver 4. mode 5. Control elements & resources In the Page Setup dialog box that displays, click Ink-saver Mode. Click OK to set the instrument to use Ink-saver mode, or click Print... to set up your print job and print the display.
Data Input and Output To Print to a File You can also print the instrument screen and its waveforms to a file. This instrument currently supports printing to BMP, JPEG, TIFF, PNG and Targa image-file formats. NOTE. Screen images saved using the PNG (Portable Network Graphics) format can consistently achieve compression ratios better than 10:1, and often better than 50:1 compared to a BMP screen image file. PNG is a lossless format similar to GIF format.
Data Input and Output To Set High Color Overview If the display screen printouts have missing information such as blacked-out readouts, your instrument may need to be set to a higher color setting. To do so, follow the steps below: To set high color Prerequisites 1. 2. Access the 3. Display Properties dialog box 4. Control elements & resources Waveforms must be displayed on screen. Your Printer must be accessible and configured properly. H See Acquiring Waveforms on page 3-- 3.
Data Input and Output Overview To set high color (cont.) Select the Set- 5. tings Tab In the Display Properties dialog box that displays, click the Settings tab. Select and Set 6. High Color Click the monitor 1 icon (if necessary) in the Settings dialog box. 7. Select High Color in the Colors list box. 8. Click OK to apply changes. If a confirmation box appears, click its OK button.
Data Input and Output NOTE. If you print the screen infrequently, you may want to return the colors setting to 256 colors except when printing. To return to 256 colors, repeat the procedure above, but select 256 colors in step 4. Remote Communication Remote communication is performed through the GPIB interface. Consult the online Programmer Guide for help with establishing remote communication and control of the instrument.
Data Input and Output 3- 140 CSA8000B & TDS8000B User Manual
Using Masks, Histograms, and Waveform Databases The instrument comes equipped with statistical tools to help you display, test, and evaluate waveforms. This section describes these tools and how you use them: H Mask Testing Waveforms, on page 3--141, describes how you can use standard or user-defined masks to set up the instrument to automatically detect mask violations in communications and other waveforms.
Using Masks, Histograms, and Waveform Databases Mask-Specific Autoset. You can set Autoset to either Auto or Manual in the Mask Setup dialog box. When set to Auto, the instrument automatically performs a standard, mask-specific autoset whenever you select a standard mask. What’s Excluded? GPIB editing. You cannot edit masks through the programmable interface (GPIB). You can, however, still create and/or delete entire masks through this interface. Concurrent Mask Tests.
Using Masks, Histograms, and Waveform Databases Mask Counts. The instrument lists statistics for each mask (polygon) in the enabled standard (or user) in the Mask readout on the right side of the instrument screen. Each mask is listed by its number, with its count of hits, the number of hits common to all masks, and the total count of waveforms acquired. Mask Editing. Masks can be edited, in which case they become a User mask.
Using Masks, Histograms, and Waveform Databases These points form the top of the mask Top/bottom dividing line (not displayed) Left-most point Right-most point These points form the bottom of the mask Figure 3- 26: Creating a user mask Note in Figure 3--27 that a new vertex has been added to the mask shown in Figure 3--26. Since the point is added above the line, it’s added to the top.
Using Masks, Histograms, and Waveform Databases H To Mask Test a Waveform Overview Masks are saved with setups, so you can save sets of masks by defining them, and then storing the instrument setup. Displayed masks are overwritten when you recall a stored setup, select a standard mask, or initialize the instrument. Use the procedure that follow to set up the instrument to mask test a waveform against a mask standard or user-defined mask set. To mask test a waveform Prerequisites 1.
Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Select the mask 3. source and turn on a mask 4. Related control elements & resources Select the waveform to be mask tested from the drop-down list under Source. Use the Comm Standard drop-down list to select a standard or user-defined mask. See Table 3-- 9 on page 3-- 142 for a list of available standard masks. Selecting a communication standard or user-defined mask automatically: 5.
Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Autoset the wave- 8. form to mask Related control elements & resources Click the Autoset button to perform a manual autoset on the mask-source waveform. Tip. You can choose to autoset the mask-source waveform to the mask anytime you select a new mask standard; just check Automatic option under Autoset. 9.
Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Related control elements & resources Restart testing 14. To restart after a Stop After condition occurs, push the front-panel CLEAR DATA front-panel button. Tip. If you want to acquire one, and only one, more waveform after the Stop After condition occurs, push the RUN/STOP front-panel button instead of CLEAR DATA.
Using Masks, Histograms, and Waveform Databases To Edit a Mask Overview When you edit a mask in an existing communications standard, the mask type switches from the selected standard to type User, and uses the masks from the Standard as a basis for editing. Use the procedure that follows. To edit a mask Prerequisites 1. Related control elements & resources The instrument must have at least one waveform turned on and the Mask Setup dialog box displayed.
Using Masks, Histograms, and Waveform Databases Overview To edit a mask (cont.) Select a 4. mask to edit Add, edit, or delete 5. mask vertices 6. Related control elements & resources Select a mask to edit from the Mask list. This section of the Mask Edit dialog box lists all masks available for edit and the number of vertices each mask has. Once you have selected a mask, use the Vertex section of the Mask Edit dialog to add, edit, or delete individual vertices.
Using Masks, Histograms, and Waveform Databases Counting Masks Mask-counting statistics are displayed in the mask readout at the right-side of the display. Mask counting statistics are displayed as soon as you enable a mask, and stay visible even if the mask isn’t displayed on screen.
Using Masks, Histograms, and Waveform Databases To Create a New Mask Overview Masks are created by connecting the points independently of the order they are entered. Points are connected by sorting the points in left-to-right order and grouping them across a diagonal from the left-most point to the right-most point. If two points share a horizontal position along either the left or right edge of the mask, the diagonal runs from the top left-most point to the bottom right-most point.
Using Masks, Histograms, and Waveform Databases Overview To create a new mask (cont.) Create a 3. new mask 4. Related control elements & resources Click Mask Edit to display the Mask Edit dialog box. In Mask list, select the user-defined mask you wish to edit. 5. Use the Vertex controls to add, position, and delete vertices on your new mask. You may also drag and drop vertices directly on the graticule display. 6.
Using Masks, Histograms, and Waveform Databases Taking Histograms The instrument can display histograms constructed of waveform data. You can display both vertical (voltage) and horizontal (time) histograms, but only one at a time. Histogram box Histogram readout Histogram Figure 3- 28: Vertical histogram view and statistics on data Why Use? What’s Special? Use histogram statistics to analyze a range of data that you select. Some histogram features of note follow: Flexible Histogram Editing.
Using Masks, Histograms, and Waveform Databases selected as its source. Histogram data is continuously accumulated and displayed until you explicitly turn it off or clear the waveform data of the histogram source. What’s Excluded? Histograms longer than 500 bins. Histograms are limited to the on screen resolution, limiting horizontal sizes of 500 bins. Multiple histograms. One histogram can be displayed on one source at a time.
Using Masks, Histograms, and Waveform Databases To Take a Histogram Overview Use the procedure that follows to quickly take a measurement based on the default settings for histograms. To take a histogram Prerequisites 1. Related control elements & resources The instrument must have at least one waveform displayed to access the Hist Setup dialog box. See page 3-- 62 for waveform-display instructions if needed. Access the 2. histogram Set, display, and 3. reset histogram source and type 4.
Using Masks, Histograms, and Waveform Databases Overview To take a histogram (cont.) Set histogram dis- 8. play options 9. Related control elements & resources Use the Histogram to turn on and off the display of the selected histogram (histogram counting remains enabled). Use the color list to select a color for the histogram. Select a value in the Size box to adjust the histogram display on screen. Select Linear to display histogram data linearly.
Using Masks, Histograms, and Waveform Databases Histogram Statistics After you check Enable Histogram in the Histogram Setup dialog box, histogram statistics appear on the right-hand side of the screen. The following table is a list of the available histogram statistics and a brief description of each. Table 3- 10: Histogram statistics 3- 158 Name Description Mean The average of all acquired points within (or on) the histogram box.
Using Masks, Histograms, and Waveform Databases Using Waveform Databases A waveform database is a three-dimensional accumulation of a source waveform as it is repeatedly acquired. In addition to the standard vertical and horizontal dimensions, each waveform sample in a waveform database has a third dimension of count. The count reflects the number of times a specific waveform point has been acquired or generated.
Using Masks, Histograms, and Waveform Databases H If all four databases are assigned and you attempt to implicitly assign a waveform source to a database (for example, by right clicking a waveform icon in the Waveform bar and selecting color grading), the instrument will display a notice that no databases are available. NOTE. The above exclusion does not mean that a waveform database cannot be used by multiple systems or features.
Using Masks, Histograms, and Waveform Databases H Grading Method: The Grading Method control determines the method by which database data (bin counts) are converted into display colors/intensities. EMPH8 selects a curve-driven grading method that utilizes eight display colors/intensities. The curve is specified by the Emphasize Counts setting, see Emphasize Counts, below. EMPH7 selects a curve-driven grading method that utilizes seven display colors/intensities.
Using Masks, Histograms, and Waveform Databases To Set Up a Waveform Database Overview To assign a waveform to one of the four waveform databases of the instrument, use the procedure that follows: To set up a waveform database Prerequisites 1. Related control elements & resources The instrument must have a waveform displayed to enable the waveform database controls. See page 3-- 62 for information on displaying waveforms. Open the Wfm 2.
Using Masks, Histograms, and Waveform Databases As you can see in the illustrations below, the normal vector view of a waveform displays the waveform data in dot mode: the waveform display is updated with each acquisition to reflect the current data. In Fig 3--30, waveform database display has been turned on and you can see the waveform data accumulation is displayed all at once, with subsequent acquisition data being “added” to the display as it is acquired.
Using Masks, Histograms, and Waveform Databases To Customize the Database Display Overview To change the display options of waveform database data on the graticule, use the procedure that follows: To customize the database display Prerequisites 1. Related control elements & resources The instrument must have a waveform assigned to one of the waveform databases. See To Set Up a Waveform Database on page 3-- 162. Access the 2. Wfm Database Setup dialog box Set Persistence 3.
Using Masks, Histograms, and Waveform Databases Overview To customize the database display (cont.) Set display options 4. Related control elements & resources Choose from the following display options: Color: Choose color to draw the waveform database in colors that vary with how frequently each sample value occurs in the database. Invert: Choose this option to reverse the color or intensity assignments to each grading partition.
Using Masks, Histograms, and Waveform Databases Overview To customize the database display (cont.) Related control elements & resources Notice the difference in intensities of the same data between these two illustrations. In the top illustration, this portion of data is lighter in intensity signalling it is least-occurring. In the illustration to the right, with Invert Color/Intensity turned on, this data appears much darker, allowing you to see the data more clearly.
Accessing Online Help This manual represents only part of the user assistance available to you — the online help system, integrated as part of the instrument user interface, provides quick-to-access support for operating the instrument. This section describes the help system and how to access it.
Accessing Online Help continue your setup. Overview help is there when you need to probe more deeply into feature operation. H Use the manuals to read instructions on putting the instrument into service, procedures on reinstalling its product software, listings of specifications, and overviews of features and their operation. See Documentation Map on page 2--2 for an description of the documents for this instrument and their purposes.
Accessing Online Help Overview To use the online help (cont.) For a more 3. robust description Click the What’s This? button in the main display or in a dialog box. The button varies in form as shown at right. After clicking, the mouse pointer changes to the following icon: 4. Now click the control you want described. A bubble pops up describing the control. See below. Control elements & resources What’s This? button for main display What’s This? button for dialog boxes For in depth, 5.
Accessing Online Help Overview 3- 170 To use the online help (cont.
Accessing Online Help Overview To use the online help (cont.) To dig deeper 6. Control elements & resources You can search for in depth help using methods with which most users of PCs are familiar: from the application menu bar, select Help, and then select Contents & Index. See illustration at right. 7. From the online help finder (see below), choose from the three tabs. 8. Click the book icons to expose topic titles, and then click a topic to highlight it.
Accessing Online Help Overview To use the online help (cont.) For instruction 9. procedures Control elements & resources You can display step-by-step setup instructions for setups you want to make: From the application menu bar, select Help, and then select Help Contents and Index. See right. From the list of topics (book icons) that displays, double-click Setup Procedures and double-click Setup dialog procedures. 10. Select a procedure from the list that displays.
Accessing Online Help Overview To use the online help (cont.) Control elements & resources To enable full- 11. If you cannot find the information in the Contents or text search Index tabs of the online finder, you may want to enable full text search: From the application menu bar, select Help, and then select Contents & Index. See illustration at right. 12. From the online help finder (see below), choose the Find tab. 13. Choose the method for word list generation and select next or finish.
Accessing Online Help Overview To use the online help (cont.) Control elements & resources Click to minimize to the toolbar To Access Op- 14. Click the minimize button to reduce the User Interface erating System Application to an icon on the operating system Help toolbar. See upper right. 15. Click the Start button to pop up the Start menu, and then select Help from the menu. See lower right. The online help for the Windows operating system displays. 16.
Cleaning the Instrument Periodically you may need to clean the exterior of your instrument. To do so, follow the instructions in this section. WARNING. Before performing any procedure that follows, power down the instrument and disconnect it from line voltage. Exterior Cleaning CAUTION. To prevent getting moisture inside the instrument during external cleaning, use only enough liquid to dampen the cloth or applicator.
Cleaning the Instrument Flat Panel Display Cleaning The instrument display is a soft plastic display and must be treated with care during cleaning. CAUTION. Improper cleaning agents or methods can damage the flat panel display. Avoid using abrasive cleaners or commercial glass cleaners to clean the display surface. Avoid spraying liquids directly on the display surface. Avoid scrubbing the display with excessive force.
Appendix A: Specifications NOTE. This specification is for the instrument; there are also specifications associated with the optical and electrical modules. Please refer to the user manual that shipped with your module for those specifications. This appendix contains the specifications for the CSA8000B Communications Signal Analyzer and the TDS8000B Digital Sampling Oscilloscope. All specifications are guaranteed unless noted as “typical.
Appendix A: Specifications Table A- 1: System - Signal acquisition (cont.) Description Characteristics Small Sampling Module Interface Tekprobe-Sampling Level 3. Hot switching is not permitted on this interface. Large Sampling Module Interface Tekprobe-Sampling Level 3. Hot switching is not permitted on this interface. 1 Total actively-acquired channels ≤ 8.
Appendix A: Specifications Table A- 2: System - Timebase (cont.) Description Characteristics n Time internal accuracy, locked to internal 100 MHz reference mode2 Strobe placement accuracy for a given horizontal interval and position on same strobe line per table below. Contribution from 80E04 sampling module is included in specification. Horizontal deskew range and resolution Range Time Interval Accuracy ≤ 20 ps/div 1 ps + 1% of interval ≥ 21 ps/div 8 ps + 0.
Appendix A: Specifications Table A- 3: System - Trigger (cont.) Description Characteristics External direct trigger capabilities and conditions Direct edge triggering on signal applied to dedicated front panel connector with Holdoff, Level Adjust, Auto/Normal, High Frequency On/Off, and Enhanced Triggering On/Off controls. External direct trigger specifications apply only under the condition that no other trigger signal is applied to respective connectors.
Appendix A: Specifications Table A- 3: System - Trigger (cont.) Description Characteristics External direct trigger metastability Metastability Reject on: Zero, typical External direct trigger real time accessory interface Tekprobe-SMA, Levels 1 and 2. Hot switching is permitted on this real time accessory interface. External prescaled trigger capabilities Prescaled triggering on signal applied to dedicated front panel connector with Holdoff, Auto/Normal, Metastability Reject On/Off.
Appendix A: Specifications Table A- 3: System - Trigger (cont.) Description Characteristics Internal clock trigger rates Rate selectable at 25, 50, 100, and 200 kHz internally and is provided to the trigger, to the TDR stimulus drives in small sampling module interfaces, and to the Internal Clock Out connector on the front panel. 1 The input resistance at the external direct trigger input and the maximum input voltage. 2 Maximum signal input for maintaining calibrated time base operation.
Appendix A: Specifications Table A- 5: Power consumption and cooling Specifications Characteristics Power requirements 240 watts (fully loaded); 160 watts (mainframe alone with no modules) An example of a “fully loaded” mainframe for these characteristic loads has installed optical modules, electrical modules, and active probes comprised of 1x80C02-CR, 1x80C04-CR2, 3x80E04, 1x80A01, and 7xP6209.
Appendix A: Specifications Table A- 7: Ports Specifications Characteristics Video outputs Two 15-pin D-subminiature connectors on the rear panel. Useable to connect external monitors that provide a duplicate of the primary display and/or a second monitor on which to view other applications. Support at least the basic requirements of the PC99 specification. Parallel port ((IEEE 1284)) 25-pin D-subminature connector on the rear panel.
Appendix A: Specifications Table A- 7: Ports (cont.) Specifications Characteristics Gated Trigger Input Enable-to-Acquire Delay (Option GT equipped instruments only) 3 trigger cycles, where each cycle is defined as (holdoff time + trigger latency). For example: With holdoff set to its minimum 5 s setting, and a 2.500 GHz clock signal applied to the External Direct Trigger input (a period of 400 ps), the Enable-to-Acquire delay is approximated as 3 x (5 s + 0.0004 s) = 15.0012 s.
Appendix A: Specifications Table A- 9: Mechanical Specifications Characteristics Construction material Chassis: Aluminum alloy Cosmetic covers: PC/ABS thermoplastic Front panel: Aluminum alloy with PC/thermoplastic overlay Module doors: Nickel plated stainless steel Bottom cover: Vinyl clad sheet metal Circuit boards: Glass-laminate. Cabinet: Aluminum. Weight 19.5 kg (43.0 lb.) (no keyboard, no mouse, no top pouch, no power cord, and no modules or front shield installed 22.0 kg (48.5 lb.
Appendix A: Specifications Certifications Table A- 10: Certifications and compliances Category Standards or description EC Declaration of Conformity EMC Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility when configured with sampling head modules designed for use with this instrument as identified in this manual.
Appendix A: Specifications Table A- 10: Certifications and compliances (cont.) Category Standards or description EN 61010-1/A2:1995 Safety requirements for electrical equipment for measurement control and laboratory use. U.S. Nationally Recognized Testing Laboratory Listing, mainframe UL3111-1 Standard for electrical measuring and test equipment. Canadian Certification, mainframe CAN/CSA C22.2 No. 1010.1 Safety requirements for electrical equipment for measurement, control, and laboratory use.
Appendix B: Automatic Measurements Reference This reference describes the automatic measurement system of this instrument. Automatic measurements support Pulse, Return-to-Zero (RZ), and Non-Returnto-Zero (NRZ) signals, providing measurements in three categories, Amplitude, Timing, and Area. This reference gathers reference information for automatic measurements.
Appendix B: Automatic Measurements Reference Pulse Measurements - Amplitude Table B--1 describes on page B--2 describes each pulse measurement in the amplitude category. See Table B--2 on page B--8 for timing category measurements; see Table B--3 on page B--14 for area category measurements. Table B- 1: Pulse Measurements — Amplitude Name Definition AC RMS The root-mean-square voltage, minus the DC component, of the waveform that is sampled within the measurement region.
Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Average Optical Power (watts) Average Optical Power (watts) = DC Signal current (DC amps) Conversion Gain (amps watts) Where: H DC Signal Current is the O/E-converter photo detector current in DC amps H Conversion Gain is the O/E-converter photo detector gain in amps/watt Note: Average optical power measurements return valid results only on channels that contain average power monitors.
Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Gain The amplitude gain between two waveforms. The measurement returns the ratio between the amplitudes measured within the measurement regions of the two sources. Gain = Amplitude1 Amplitude2 Where Amplitude1 and Amplitude2 are the Amplitude measurements of the two source waveforms. See Amplitude on page B-- 2.
Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Mid The computation of the middle point between the maximum and minimum amplitude peaks of the waveform over the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-- 83.
Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition +Overshoot The ratio of the maximum peak to the signal amplitude over the measurement region, expressed as a percentage. + Overshoot = 100 × (Max − High) (High − Low) Where: H Max is the signal maximum H High and Low are the 100% and 0% reference levels If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2).
Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Peak-to-Peak Noise The maximum range of the waveform amplitude variance sampled within a fixed width vertical slice located at the center of the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-- 83. This measurement requires the use of a waveform database.
Appendix B: Automatic Measurements Reference Pulse Measurements - Timing Table B--2 describes each pulse measurement in the timing category. See Table on B--1 on page B--2 for amplitude category measurements; see Table B--3 on page B--14 for area category measurements. Table B- 2: Pulse Measurements - Timing Name Definition Burst width The time between the first and last crossings, either positive or negative, of the waveform at the mid-reference level in the measurement region.
Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Delay The time interval between the crossings of the two mid-reference levels on the two sources of the measurement. Delay = Tcross(source1) – Tcross(source2) Where Tcross is the first positive or negative crossing time at mid-reference level. See Pulse Crossings and Mid-reference Level on page B-- 58. The mid-reference levels are adjustable and default to 50% of the pulse amplitude.
Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition - Duty Cycle The ratio (expressed as a percentage) of the first negative pulse width within the measurement region to the period of the signal. The time intervals are determined at mid-reference level.
Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Period The time interval between two consecutive crossings on the same slope of the signal at the mid-reference level. Period = Tcross3 – Tcross1 Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the same slope at the mid-reference level. The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Rise Time The time interval between the low-reference level and the high reference level crossings on the positive slope of the pulse. RZ Rise Time = TcrossH – HcrossL Where: H TcrossH is the time of crossing of the high reference level. H TcrossL is the time of crossing of the low reference level.
Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition +Width The horizontal interval between the crossings of the rising and falling edges at the mid-reference level of the first positive pulse in the measurement region. +Width = Tcross2 – Tcross1 Where Tcross1 and Tcross2 are the two consecutive horizontal crossings on the first positive pulse. The mid-reference level is adjustable and defaults to 50% of the pulse amplitude.
Appendix B: Automatic Measurements Reference Pulse Measurement - Area Table B--3 describes each pulse measurement in the area category. See Table B--1 on page B--2 amplitude-category measurements; see Table B--2 on page B--8 for timing-category measurements. Table B- 3: Pulse Measurements - Area Name Definition Area The area under the curve for the waveform within the measurement region. Area measured above ground is positive; area measured below ground is negative.
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Amplitude Table B--4 describes each RZ measurement in the amplitude category. See Table on B--5 on page B--29 for timing category measurements; see Table B--6 on page B--36 for area category measurements. Table B- 4: RZ Measurements - Amplitude Name Definition RZ AC RMS The root mean square amplitude, minus the DC component, of the waveform that is sampled within the measurement region.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Average Optical Power (dBm) The true average component of an optical signal, expressed in decibels. This measurement results from the use of a hardware average power monitor circuit rather than from the calculation of digitized waveform data. Note: Average optical power measurements return valid results only on channels that contain average power monitors.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Extinction Ratio The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical RZ signal. All level determinations are made within the RZ Eye Aperture. RZ ExtRatio = High Low Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters on B-- 62. The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Extinction Ratio (dB) The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical RZ signal, expressed in decibels, dB. All level determinations are made within the RZ Eye Aperture. ᏋHigh Ꮠ Low RZ ExtRatio [dB] = 10 × log Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters on B-- 62.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Eye Opening Factor RZ Eye Opening Factor is a measure of how noise affects the vertical opening between High and Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the pulse, respectively.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ High The logical 1 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is built from the upper half of the RZ eye, and the mean of the histogram yields the High level. The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width. See RZ Eye Aperture Parameters on B-- 62.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Max The maximum vertical value of the waveform that is sampled within the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2). When this measurement is turned on, it will automatically set the measurement system to use a waveform database if available.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Min The minimum vertical value of the waveform that is sampled within the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2). When this measurement is turned on, it will automatically set the measurement system to use a waveform database if available.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Peak-to-Peak Noise The maximum range of the data distribution sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters on B-- 62. PkPk noise = Highpp or PkPk noise = Lowpp The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Q Factor A figure of merit of an eye diagram, reporting the ratio between the amplitude of the RZ pulse to the total RMS noise on the High and Low levels. The RZ pulse is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the pulse, respectively.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ RMS Noise One standard deviation of the data distribution sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels. RMS noise = Highσ or RMS noise = Lowσ The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio The ratio of the average power level of the logic High to the Suppressed level measured between two consecutive RZ pulses. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio (%) The inverse ratio of the average power level of the logic High to the Suppressed level measured between two consecutive RZ pulses, with the result expressed in percentage. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio (dB) The ratio of the average power level of the logic High to the Suppressed level measured between two consecutive RZ pulses, with the result expressed in decibels. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Timing Table B--5 topic describes each RZ measurement in the timing category. See Table B--4 on page B--15 for amplitude category measurements; see Table B--6 on page B--36 for area category measurements. Table B- 5: RZ Measurements - Timing Name Definition RZ Bit Rate The inverse of the time interval between two consecutive rising or falling edges (i.e. the reciprocal of the Bit Time).
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Cross+ The time of a positive crossing, defined as the mean of the histogram of the data sampled at the mid-reference level. Cross+ = Tcross Where Tcross is the mean of the histogram of a positive crossing. See RZ Crossings on page B-- 61. The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude. See Mid-reference level on page B-- 69.
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Delay The time interval between the crossings of the mid-reference levels on the two sources of the measurement. The crossing times are computed as the mean of the histogram of the data slice at the mid-reference level. RZ Delay = Tcross(source1) – Tcross(source2) Where Tcross is the mean of the histogram of a positive or negative crossing at mid-reference level. See RZ Crossings on page B-- 61.
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Eye Width The 3σ guarded delta between the rising and falling edge crossings. Eye Width = (Tcross2 – 3 * Tcross2σ) – (Tcross1 + 3 * Tcross1σ) Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings. See RZ Crossings on page B-- 61. The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude. See Mid-reference level on page B-- 69.
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Phase Phase = Tcross1 of source2 − Tcross1 of source1 ⋅ 360 Tcross3 of source1 − Tcross1 of source1 Where: H Tcross1 of source1 is mean of the histogram at the time of the first crossing of either polarity on source 1. See RZ Crossings on page B-- 61. H Tcross3 of source1 is the mean of the histogram at time of the next crossing on source 1of the same polarity as Tcross1.
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Pulse Symmetry RZ Pulse Symmetry measures to what extent the RZ pulse is symmetrical around the peak at the mid-reference level. The pulse peak is the center of the interval, sized to Eye Aperture, which yields the maximum mean vertical value. See RZ Eye-Aperture Parameters on page B-- 62.
Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ RMS Jitter Jitter is the measure of time variance at the location where the signal crosses the mid-reference level. RMS Jitter is defined as one standard deviation (σ) of that variance. The mean of the histogram of the crossing data distribution is Tcross. RMS Jitter = Tcrossσ The mid-reference level is adjustable and defaults to 50% of the RZ maximum pulse amplitude.
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Area Table B--6 describes each RZ measurement in the area category. See Table B--4 on page B--15 for amplitude category measurements; see Table on B--5 on page B--29 for timing category measurements Table B- 6: RZ Measurements - Area Name Definition RZ Area The area under the curve for the RZ waveform within the measurement region. Area measured above ground is positive; area measured below ground is negative.
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Amplitude Table B--7 topic describes each NRZ measurement in the amplitude category. See Table B--8 on page B--50 for timing category measurements.; see Table B--9 on page B--55 for area category measurements. Table B- 7: NRZ Measurements - Amplitude Name Definition NRZ AC RMS The root mean square amplitude, minus the DC component, of the selected waveform within the measurement region.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Average Optical Power (dBm) The true average component of an optical signal, expressed in decibels. This measurement results from the use of a hardware average power monitor circuit rather than from the calculation of digitized waveform data. Note: Average optical power measurements return valid results only on channels that contain average power monitors.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Crossing % The height of eye crossing as a percentage of eye height measured in the Eye Aperture. NRZ Crossing % = 100 × (Eye Cross − Low) (High − Low) Where High and Low are the logical 1 and 0 levels, and EyeCross is the level at eye crossing. See NRZ Eye-Aperture Parameters on page B-- 65. The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Extinction Ratio The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical NRZ signal. All level determinations are made within the NRZ Eye Aperture. Ꮛ Ꮠ NRZ ExtRatio = 100 × Low High Where High and Low are the logical 1 and 0 levels. The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Extinction Ratio (dB) The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical NRZ signal, expressed in decibels (dB). All level determinations are made within the NRZ Eye Aperture. ᏋHigh Ꮠ Low NRZ ExtRatio [dB] = 10 × log Where High and Low are the logical 1 and 0 levels. See RZ Eye Aperture Parameters on B-- 62.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Gain The amplitude gain between two waveforms. The measurement returns the ratio between the amplitudes measured within the Eye Aperture of each of the waveforms. NRZ Gain = Ampl2 Ampl1 Where Ampl1 and Ampl2 are the amplitudes of the two source waveforms. See NRZ Amplitude on page B-- 37. The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Low The logical 0 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is built from the lower half of the NRZ eye, and the mean of the histogram yields the Low level. The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time. See RZ Eye Aperture Parameters on B-- 62.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Mid The middle level between the Max and Min vertical values of the selected waveform within the measurement region. NRZ Mid = (Max + Min) 2 Where Max and Min are the maximum and minimum measurements. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2). See To Localize a Measurement on page 3-- 83.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ +Overshoot The ratio of the maximum value of the measured signal to its amplitude, expressed as a percentage. The waveform is scanned for the maximum value within the measurement region, while the amplitude is measured in the Eye Aperture. NRZ + Overshoot = 100 × (Max − High) (High − Low) Where Max is the signal maximum, and High and Low are the logical 1 and 0 levels.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Optical Modulation Amplitude An approximation defined as the difference of the logical power 1 and 0 determined in a vertical slice through the eye crossing. The levels are determined as the means of the histograms of the vertical data slice through the High (logical 1) and Low (logical 0) levels.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Peak-to-Peak Noise The maximum range of the amplitude variance sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters on B-- 62. PkPk noise = Highpp or PkPk noise = Lowpp The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Q Factor NRZ Q Factor is a figure of merit of an eye diagram, reporting the ratio between the amplitude of the NRZ eye to the total RMS noise on the High and Low levels. The NRZ eye is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the eye, respectively.
Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ RMS Noise One standard deviation of the amplitude variance sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels. RMS noise = Highσ or RMS noise = Lowσ The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Timing Table B--8 topic describes each NRZ measurement in the timing category. See Table B--7 on page B--37 for amplitude category measurements.; see Table B--9 on page B--55 for area category measurements. Table B- 8: NRZ Measurements - Timing Name Definition NRZ Bit Rate The inverse of the time interval between two consecutive eye-crossing points. In other words, it is the reciprocal of the Bit Time.
Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Delay The time interval between the crossings of the mid-reference levels on the two sources of the measurement. NRZ Delay = Tcross(source1) – Tcross(source2) Where Tcross is the positive or negative crossing time at mid-reference level. The mid-reference level is adjustable and defaults to 50% of the NRZ eye amplitude. See NRZ Crossings on page B-- 64.
Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Fall Time NRZ Fall Time characterizes the negative slope of the NRZ eye by computing the time interval between the mean crossings of the high reference level and the low reference level. RZ Fall Time = TcrossL - TcrossH Where TcrossL is the mean of the histogram of the crossing of the low reference level, and TcrossH is the mean of the histogram of the crossing of the high reference level.
Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Phase Phase = Tcross1 of source2 − Tcross1 of source1 ⋅ 360 Tcross3 of source1 − Tcross1 of source1 Where: H Tcross1 of source1 is the time of the first crossing of either polarity on source 1. H Tcross3 of source1 is the time of next crossing on source 1of the same polarity as Tcross1.
Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Rise Time Computes the time interval between the mean crossings of the low reference level and the high reference level to characterize the positive slope of the eye. NRZ Rise Time = TcrossH - HcrossL Where TcrossH is the mean of the histogram of the crossing of the high reference level, and TcrossL is the mean of the histogram of the crossing of the low reference level.
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Area Table B--9 topic describes each NRZ measurement in the area category. See Table B--7 on page B--37 for amplitude category measurements.; see Table B--8 on page B--50 for timing category measurements. Table B- 9: NRZ Measurements - Area Name Definition NRZ Area The area under the curve for the NRZ waveform within the measurement region. Area measured above ground is positive; area measured below ground is negative.
Measurement Reference Parameters and Methods This reference topic describes the reference parameters (levels and crossings) used in taking the measurements. All Sources Reference-Level Calculation Methods The methods available for calculating reference levels used in taking automatic measurement follow. The methods are shown using a pulse, but they also apply to RZ and NRZ waveforms.
Measurement Reference Parameters and Methods Pulse Sources The automatic measurement system uses the following levels when measuring Pulse source waveforms. For the Pulse measurements, and their definitions that use the levels described here, see page B--2.
Measurement Reference Parameters and Methods Pulse Crossings and Mid-reference Level Mid-reference Tcross1 Tcross2 Tcross3 Figure B- 3: Pulse crossings and mid-reference level Pulse Crossings and Mid-reference Level (AOP) B- 58 The following measurement parameters are normally used when measuring Optical Modulation Amplitude on a pulse.
Measurement Reference Parameters and Methods Eye aperature Power logic 1 Average optical power Tcross1 Tcross3 Tcross2 Power logic 0 Figure B- 4: AOP pulse crossings and mid-reference level Overshoot Levels Max High Low Figure B- 5: Overshoot levels CSA8000B & TDS8000B User Manual B- 59
Measurement Reference Parameters and Methods RZ Sources The automatic measurement system uses the following levels when measuring RZ source waveforms. For the RZ measurements, and their definitions that use the levels described here, see page B--15. RZ Measurement Reference Levels The following levels are used when deriving measurements on RZ waveforms.
Measurement Reference Parameters and Methods RZ Crossings The following measurement parameters are used when deriving RZ measurements.
Measurement Reference Parameters and Methods RZ Eye-Aperture Parameters The following parameters are used when deriving measurements on RZ waveforms. Eye aperture Mid reference High High reference Low reference Low Figure B- 8: RZ eye- aperture parameters NRZ Sources The automatic measurement system uses the following levels when measuring NRZ source waveforms. For the NRZ measurements, and their definitions that use the levels described here, see page B--37.
Measurement Reference Parameters and Methods NRZ Measurement Reference Levels The following levels are used when deriving measurements on NRZ waveforms.
Measurement Reference Parameters and Methods NRZ Crossings The following measurement parameters are used when deriving NRZ measurements.
Measurement Reference Parameters and Methods NRZ Eye-Aperture Parameters The following parameters are used when deriving measurements on NRZ waveforms.
Measurement Reference Parameters and Methods NRZ Overshoot Levels The following measurement parameters are used when deriving overshoot measurements on NRZ waveforms.
Measurement Reference Parameters and Methods NRZ Crossings (OMA) The following measurement parameters are used when approximating Optical Modulation Amplitude (OMA) on NRZ waveforms. As shown, OMA on NRZ waveforms is determined from the means of histograms of the data from level 1 and level 0, taken on a vertical slice through the NRZ eye crossing.
Measurement Reference Parameters and Methods Tracking Methods This topic describes measurements methods tracking the High and Low values used in taking automatic measurements. The levels that the automatic measurement system derives as the High (Top) or Low (Bottom) for a waveform influence the fidelity of amplitude and aberration measurements.
Measurement Reference Parameters and Methods Mode Tracking Method High Mode (of Histogram) sets the values statistically. Using a histogram, it selects the most common value either above or below the midpoint (depending on whether it is defining the high or low reference level). Since this statistical approach ignores short-term aberrations (overshoot, ringing, and so on), Mode is the best setting for examining pulses.
Measurement Reference Parameters and Methods Use a Waveform Database This measurement needs to be performed using a statistical (waveform) database. When one is specified, the instrument acquires or computes the targeted measurement source, then accumulates it into in the waveform database, and then takes the measurement on the database data.
Glossary Accuracy The closeness of the indicated value to the true value. Acquisition The process of sampling signals from input channels, digitizing the samples into data points, and assembling the data points into a waveform record. The waveform record is stored in memory. The trigger marks time zero in that process. Active cursor The cursor that moves when you turn the general purpose knob. It is represented in the display by a solid line.
Glossary Autoset A function of the instrument that attempts to automatically produce a stable waveform of usable size. Autoset sets up the acquisition controls based on the characteristics of the selected waveform. A successful autoset will produce a coherent and stable waveform display. Average acquisition mode In this mode, the instrument displays and updates a waveform that is the averaged result of several waveform acquisitions. Averaging reduces the apparent noise.
Glossary Channel number The number assigned to a specific signal input channel of an installed sampling module. Assignment of channel numbers is described in Maximum Configuration on page 1--11. Channel waveforms Waveforms resulting from signals input into sampling-module channels and digitized and acquired by the instrument. See Live Waveforms. Control knob see Knob Coupling The association of two or more circuits or systems in such a way that power or information can be transferred from one to the other.
Glossary Error detection Checking for errors in data transmission. A calculation is made on the data being sent and the results are sent along with it. The receiving station then performs the same calculation and compares its results with those sent. Each data signal conforms to specific rules of construction so that departures from this construction in the received signals can be detected.
Glossary instruments in a network under the control of a controller. Also known as IEEE 488 bus. It transfers data with eight parallel data lines, five control lines, and three handshake lines. Graticule A grid on the display screen that creates the horizontal and vertical axes. You can use it to visually measure waveform parameters. Graticule labels Each graticule displays three labels.
Glossary when horizontal scale adjustments are made. The horizontal reference point remains anchored as the rest of the waveform grows or shrinks around it. Icon See Channel Icon. Initialize Setting the instrument to a completely known, default condition by pressing executing a Default Setup. Internal clock A trigger source that is synchronized to the internal clock, with a selectable repetition rate.
Glossary Measurement See Automatic Measurement. Measurement statistics The accumulation of a history of individual measurement readouts, showing the mean and standard deviation of a selected number of samples. Measurement updating The process of automatically adjusting the measurement parameters to reflect changes in the waveform targeted by an automatic measurement. MidRef The waveform middle reference level used in such measurements as Period and Duty Cycle. Typically set to 50%.
Glossary Quantizing The process of converting an analog input that has been sampled, such as a voltage, to a digital value. Return to Zero (RZ) A waveform type for of a source to be measured (see waveform types). Real-time sampling An alternate sampling mode where the instrument samples to completely fill a waveform record from a single trigger event. This instrument does not use real time sampling; it samples sequentially. See Sequential equivalent-time sampling on page Glossary--9.
Glossary Sequential equivalent-time sampling A type of equivalent-time sampling in which one sample is taken per acquisition, with each sample skewed incrementally with respect to an external trigger event. This instrument acquires using sequential equivalenttime sampling. Saved waveform A collection of sampled points that constitute a single waveform that is saved in any one on reference locations R1 - R8 or to the file system. Slope The direction at a point on a waveform.
Glossary View Any one of the three waveform displays the instrument provides: Main, Mag1, and Mag2. Each view has its own graticule and time base. The instrument always displays the Main view; the Mag1 and Mag2 views can be added and removed from the display using the View buttons on the front panel.
Index A Accessories list, 1-- 41 optional, 1-- 42 standard, 1-- 41 Accuracy, Glossary-- 1 Acquiring Waveforms, 3-- 3 Acquisition, Glossary-- 1 cycle, 3-- 29 horizontal delay, 3-- 28 horizontal delay time with, Glossary-- 5 how to start and stop, 3-- 26 input channels and digitizers, 3-- 27 modes for starting and stopping, 3-- 22 overview, 3-- 27 preventing aliasing, 3-- 23 record, 3-- 28 record length, 3-- 28 sample interval, 3-- 28 sampling (see Sampling), 3-- 27–3-- 29 set Stop mode & action, 3-- 25 time
Index Bar Controls, 2-- 7 Measurements, 2-- 7 Menu, 2-- 7 Readouts, 2-- 7 Status, 2-- 7 Tool, 2-- 7 Waveform, 2-- 7 BER, Glossary-- 2 BER floor, Glossary-- 2 Bit error, Glossary-- 2 Brightness/Contrast adjustment, 1-- 15 Button, SELECT, Glossary-- 8 C CD, instrument software, 1-- 3 Certifications, for instrument, A-- 11 Channel, Glossary-- 2 icon, Glossary-- 2 number, Glossary-- 3 waveforms, Glossary-- 3 Channel icon, Glossary-- 2 Channel-probe deskew, Glossary-- 2 Channels in sampling modules, 3-- 27 max
Index horizontal reference, defined, 3-- 54 horizontal scale readout, defined, 3-- 54 how to customize, 3-- 69 how to set style of, 3-- 68 limit readouts, defined, 3-- 54 map—Main & Mag views, 2-- 10 map—Main view, 2-- 9 mode Infinite Persistence, 3-- 67 Normal, 3-- 67 Variable Persistence, 3-- 67 multiple views, 3-- 55 preview field, defined, 3-- 54 printing, 3-- 132 keys to using, 3-- 56 setting high color, 3-- 137 system, Glossary-- 3 time base views, defined, 3-- 54 touchscreen, defined, 3-- 55 customi
Index size, 3-- 155 supported statistics, table of, 3-- 158 taking, 3-- 154 to take, 3-- 156 usage limitations, 3-- 155 valid sources of, 3-- 154 why use, 3-- 154 Holdoff, triggering, 3-- 45 usable limits, 3-- 46 Holdoff, trigger, Glossary-- 5 Bit error, to capture, 3-- 36 Horizontal Bar cursors, Glossary-- 5 delay time, Glossary-- 5 discussion of parameters, 3-- 17 interrelation of parameters, 3-- 19 position, 3-- 7 scaling, 3-- 4 set up procedure, 3-- 8 time range (acquisition window), Glossary-- 5 Horiz
Index Map acquisition process, 2-- 6 documentation, 2-- 2 front panel, 2-- 8 input/output (front panel), 2-- 11 input/output (rear panel), 2-- 12 system, 2-- 4 user interface, 2-- 7 waveform display, 2-- 9 Mask testing, 3-- 141, 3-- 145 autoset to a mask, 3-- 147 clearing statistics counts, 3-- 151 count statistics, 3-- 143 creating a user mask (figure), 3-- 144 definition of counts (statistics), 3-- 151 editing description, 3-- 143 flexible features of, 3-- 141 stopping acquisition based on, 3-- 147 suppo
Index Amplitude-related, B-- 37 Area-related, B-- 55 Timing-related, B-- 50 Normal display mode, 3-- 67 trigger mode, 3-- 41 NRZ measurements-amplitude, B-- 37 NRZ measurements-area, B-- 55 NRZ measurements-timing, B-- 50 O Offset, vertical, 3-- 14 OMA, optical modulation amplitude, Glossary-- 7 On/Standby button, 1-- 13, 1-- 15 Online, documentation, 2-- 1 Online Help, 2-- 1, 2-- 2 accessing, 3-- 167 how to use, 3-- 168 types available, 3-- 167 Online help displaying control descriptions, 3-- 168 display
Index To gated trigger, 3-- 50 To Localize a Measurement, 3-- 83 To Mask Test a Waveform, 3-- 145 To Perform Dark-Level and User Wavelength Gain Compensations, 3-- 98 To Recall Your Setup, 3-- 118 To Recall Your Waveform, 3-- 124 To Reset the Instrument, 3-- 13 To Save Your Setup, 3-- 115 To Save Your Waveform, 3-- 121 To Set Acquisition Modes, 3-- 24 To Set Display Styles, 3-- 68 To Set the Cursor Sources, 3-- 90 To set up a waveform database, 3-- 162 To Acquire in FrameScan mode, 3-- 33 To Catch a Bit Er
Index Save and recall of waveforms adding a comment, 3-- 123 usage limitations, 3-- 120 Save Mode, if Windows starts in, 1-- 16 Saved waveform, saved, Glossary-- 9 Saving a setup, 3-- 113 Saving a waveform, 3-- 120 Saving and recalling setups including comments, 3-- 114 virtual keyboard with, 3-- 114 why use, 3-- 113 Saving and recalling waveforms including comments, 3-- 120 virtual keyboard with, 3-- 120 why use, 3-- 120 Saving images, PNG format, 3-- 136 Scale, considerations for setting, 3-- 6 Screen pr
Index Triggering, 3-- 39, 3-- 104–3-- 112 based on application, 3-- 43 edge, 3-- 40–3-- 52 high frequency, 3-- 45 holdoff, 3-- 45 how to set, 3-- 48 keys to using, 3-- 40 metastability reject, 3-- 45 overview (of process), 3-- 40 overview of, 3-- 39 purpose, 3-- 39 why use, 3-- 39 U Update, software, 1-- 4 Upgrade, firmware, 1-- 4 URL, Tektronix, xiii Usable holdoff, 3-- 46 User Interface Controls bar, 2-- 7 map, 2-- 7 Measurements bar, 2-- 7 Menu bar, 2-- 7 Readouts bar, 2-- 7 readouts display, 2-- 7 Sta
Index Waveform databases behavior with automatic measurements, 3-- 76 dimensions of, 3-- 160 BIN7, 3-- 161 BIN8, 3-- 161 color, 3-- 160 display, 3-- 160 display options, 3-- 160 EMPH7, 3-- 161 EMPH8, 3-- 161 emphasize counts, 3-- 161 intensity, 3-- 160 invert, 3-- 160 persistence, 3-- 161 special features, 3-- 159 To customize display of, 3-- 164 to set up, 3-- 162 four database limit, 3-- 159 usage limitations, 3-- 159 vs.
