User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix D: Sample Waveforms
D-10 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Table D-17: Isolated pulse for disk application
File name E2PR4.EQU Made with equation editor
Equation
’E2PR4 Pulse
spcell = 10 ’Samples/Cell
cperiod = 10e-9 ’Cell Period [sec]
ncells = 20 ’Number of Cells
clock = spcell/cperiod ’Samples/Cell / Cell Period [Hz]
size = spcell*ncells ’Samples/Cell * Number of Cells
k0 = ncells*pi ’Number of Cells * PI
k1 = 0.5
a = pi*3/32
E2PR4.WFM = a * (sinc(k0*(scale-k1)) +
3*sinc(k0*(scale-k1)+pi) +
3*sinc(k0*(scale-k1)+2*pi) +
sinc(k0*(scale-k1)+3*pi) )
Descriptions
This is the isolated pulse for the E2PR4. This sample equation
makes the E2PR4.WFM waveform with 200 waveform points
(Samples/Cell × Number of Cells).
Settings
Table D-18: Isolated pulse for network application
File name E1.WFM Made with waveform editor
Descriptions
This is the isolated pulse for the ITU-T E1. The number of waveform
points is 84.
This isolated pulse is applied to ITU-T E2, ITU-T E3, and T1.102
DS1C.
Settings