User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix D: Sample Waveforms
D-8 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Table D-12: Pulse width modulation
File name PWM.WFM Made with waveform editor
Descriptions
The waveform editor is used to create a ramp wave of 1000 periods
and a sine wave of 1 period, and these two waveforms are compared
to create the PWM.WFM waveform.
Settings
Waveform points: 32000, Clock frequency: 1.0 GHz, Output time: 32
µs
Table D-13: Pseudo–random pulse
File name PRBS9.WFM Made with waveform editor
Descriptions
An M–series pseudo–random signal is created using the waveform
editor’s timing display shift register generator function.
Register length = 15
The encoding is NRZ.
Settings
Waveform points: 4088 ((2
9
-1) x 8), Clock frequency: 2.0 GHz,
Output time: 2.044 µs
Table D-14: Waveform for magnetic disk signal
File name DSK.WFM Made with disk application
Descriptions
Creates a disk signal pattern with NRZ–I modulation using the disk
application. This signal is created with default parameter settings.
Samples/Cell 20
Cell Period 20 ns
TA A + 1 . 0
TA A - - 1 . 0
PW50+ 50 %
PW50- 50%
NLTS 0%
NLTS+ 0%
NLTS- 0%
Asymmetry 0%
The encoding is NRZ–I.
A signal with the same pattern is set for the marker 1 as well.
Settings
Waveform points: 10220, Clock frequency: 1.0 GHz,
Output time: 10220 ns