User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

Appendix D: Sample Waveforms
D-6 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Table D-8: Linear frequency sweep
File name LIN_SWP.WFM Made with equation editor
Equation
clock = 1e9
size = 8000
k0 = 8e-6 ’sweep period
k1 = 1e6 ’start frequency
k2 = 10e6 ’end frequency
“lin_swp.wfm” = sin(2 * pi * k1 * time + 2 * pi * (k2 - k1) * (time ^ 2)/2/k0)
Descriptions
This waveform can be expressed generally by the following formula.
Here f
1
is the starting frequency, f
2
is the ending frequency, is
the initial phase, and T is the sweep period.
To assure that the phases match when this waveform is iterated, the
sweep period is set to be close to an integer multiple of the reciprocal
of the average frequency .
Settings
Waveform points: 8000, Clock frequency: 1.0 GHz, Output time:
8000 ns
Vt() 2πf
1
t 2πf
2
t
T
---
t
φ
0
+d
0
t
∫
+sin=
φ
0
f
1
f
2
+
2
--------------
Table D-9: Log frequency sweep
File name LOG_SWP.WFM Made with equation editor
Equation
clock = 800e6
size = 8800
k0 = 11e-6 ’sweep period
k1 = 1e6 ’start frequency
k2 = 10e6 ’end frequency
k3 = log (k2 / k1)
“log_swp.wfm” = sin(2 * pi * k1 * k0 / k3 * (exp (k3 * scale) -1))
Descriptions
This waveform can be expressed generally by the following formula.
Here f
1
is the starting frequency, f
2
is the ending frequency, is the
initial phase, and T is the sweep period.
To assure that the phases match when this waveform is iterated, the
sweep period is set to be close to an integer multiple of the reciprocal
of the average frequency .
Settings
Waveform points: 8800, Clock frequency: 800 MHz, Output time: 11 µs
Vt() 2πf
1
t
T
---
In
f
2
f
1
----
⋅
exp t
φ
0
+d
0
t
∫
sin=
φ
0
f
2
f
1
–
In
f
2
f
1
----
--------------