User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

Appendix D: Sample Waveforms
AWG710&AWG710B Arbitrary Waveform Generator User Manual D-3
Table D-3: Lorentz pulse
File name LORENTZ_P.WFM Made with equation editor
Equation
size = 1024
clock = 1e9
’pulse width k0 = 20e-9
’peak location k1 = 512e-9
“lorentz.wfm” = 1 / (1+(2*(time - k1) / k0) ^ 2)
Descriptions
When the pulse width is taken to be tw50, the waveform can be
expressed by the following formula:
Settings
Waveform points: 1024, Clock frequency: 1.0 GHz,
Output time: 1024 ns
Vt()
1
12
t
t
w50
---------
2
+
----------------------------------=
Table D-4: Sampling function SIN(X)/X pulse
File name SINC.WFM Made with equation editor
Equation
size = 2048
clock = 1e9
’sine frequency k0 = 50e6
’peak location k1 = 1024e-9
“sinc.wfm” = sinc(2 * pi * k0 * (time - k1))
Descriptions
In general, this waveform is expressed by the following formula:
This is the impulse response for the ideal low pass filter for the
frequency bandwidth f. At least 42 periods are required to use a
vertical resolution of 8 bits.
Settings
Waveform points: 2048, Clock frequency: 1.0 GHz,
Output time: 2048 ns
Vt()
2πft()sin
2πft
------------------------=