User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix B: Performance Verification (AWG710)
B-92 AWG710&AWG710B Arbitrary Waveform Generator User Manual
3. Set the oscilloscope controls as follows:
4. Set all the switches of the ground closure to open.
5. Follow the substeps below to set the AWG710 Arbitrary Waveform Generator
controls and select the sequence file:
a. Push UTILITY (front–panel)!System (bottom)!Factory Reset
(side)!OK (side).
b. Load the PT_EVENT.SEQ file.
Refer to Loading Files on page B-62 for file loading procedures.
c. Push SETUP (front–panel)!Run Mode (bottom)!Enhanced (side) to
set the enhanced mode.
6. Push the RUN and CH1 OUT buttons.
The LEDs above the RUN button and CH1 output connector are on.
7. Check the EVENT IN connector pin 0 input:
a. Verify that a waveform displayed on the oscilloscope has the same
amplitude as shown in Figure B-55.
Vertical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CH1
CH1 coupling. . . . . . . . . . . . . . . . . . . . . . . . . DC
CH1 scale . . . . . . . . . . . . . . . . . . . . . . . . . . . 200 mV/div
CH1 input impedance . . . . . . . . . . . . . . . . . . 50 Ω
Horizontal
Sweep . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 ns/div or 400 ns/div
Trigger
Source. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CH1
Coupling . . . . . . . . . . . . . . . . . . . . . . . . . . . . DC
Slope. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Positive
Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +100 mV
Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Auto