User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix B: Performance Verification (AWG710)
AWG710&AWG710B Arbitrary Waveform Generator User Manual B-91
Event Input and Enhanced Mode Tests
These procedures check the event input signals and enhanced mode operation.
Check Event Input with
Strobe Off
Do the following steps to install the test hookup and set the test equipment controls:
1. Use a 50Ω SMA coaxial cable and a SMA(Fe)–BNC(Fe) adapter to connect
the AWG710 Arbitrary Waveform Generator CH1 output connector to the
oscilloscope CH1 input connector (see Figure B-54).
Figure B-54: Event input and enhanced mode initial test hookup
2. Connect the ground closure to the EVENT IN connector on the AWG710
Arbitrary Waveform Generator rear panel.
NOTE. The event input check with strobe off and the strobe input check are
structured as a continuous test. After Check Event Input with Strobe Off, the next
test uses the connections and oscilloscope settings from the previous test.
Equipment
required
A 50 Ω SMA coaxial cable, a SMA(Fe)–BNC(Ma) adapter an oscilloscope
(TDS700), and custom–made ground closure. See Figure B-37 for the
connections.
Prerequisites
The AWG710 Arbitrary Waveform Generator must meet the prerequisites
listed on page B-61.
AWG710 Arbitrary Waveform Generator Oscilloscope (TDS700)
50 Ω SMA coaxial cable
SMA(Female)-BNC
(Male) adapter