User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix B: Performance Verification (AWG710)
B-66 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Operating Mode Tests
The following procedures verify the operation of the Cont, Triggered and Gated
modes.
Check Cont Mode
Do the following steps to install the test hookup and set the test equipment controls:
1. Use a 50
Ω SMA coaxial cable to connect the AWG710 Arbitrary Waveform
Generator CH1 output connector to the oscilloscope CH1 input connector (see
Figure B-39).
Figure B-39: Cont mode initial test hookup
2. Set the oscilloscope controls as follows:
NOTE. When you output signal from the CH1 or CH1 OUTPUT, check that the
other OUTPUT ( CH1
or CH1 ) LED is off.
If the other OUTPUT LED is on, push the CH1
or CH1 OUT button to turn off the
output.
Equipment
required
A 50 Ω SMA coaxial cable, a SMA(Fe)–BNC(Ma) adapter and an
oscilloscope (TDS700).
Prerequisites
The AWG710 Arbitrary Waveform Generator must meet the prerequisites
listed on page B-61.
Vertical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CH1
CH1 coupling. . . . . . . . . . . . . . . . . . . . . . . . . DC
CH1 scale . . . . . . . . . . . . . . . . . . . . . . . . . . . 200 mV/div
CH1 input impedance . . . . . . . . . . . . . . . . . . 50 Ω
Horizontal
Sweep . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 ns/div
AWG710 Arbitrary Waveform Generator Oscilloscope (TDS700)
50 Ω SMA coaxial cable
SMA(Female)-BNC
(Male) adapter