User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix B: Performance Verification (AWG710)
AWG710&AWG710B Arbitrary Waveform Generator User Manual B-55
Appendix B: Performance Verification (AWG710)
Two types of Performance Verification procedures can be performed on this
product: Self Tests and Performance Tests. You may not need to perform all of these
procedures, depending on what you want to accomplish.
Verify that the AWG710 Arbitrary Waveform Generator is operating correctly
by running the self tests which begin on page B-56.
Advantages: These procedures require minimal time to perform, require no
additional equipment, and test the internal hardware of the AWG710 Arbitrary
Waveform Generator.
If a more extensive confirmation of performance is desired, complete the self
test, and then do the performance test beginning on page B-60.
Advantages: These procedures add direct checking of warranted
specifications. They require more time to perform and suitable test equipment
is required. (Refer to Equipment Required on page B-61).
Conventions
Throughout these procedures the following conventions apply:
Each test procedure uses the following general format:
Title of Test
Equipment Required
Prerequisites
Procedure
Each procedure consists of as many steps, substeps, and subparts as required
to do the test. Steps, substeps, and subparts are sequenced as follows:
1. First Step
a. First Substep
First Subpart
Second Subpart
b. Second Substep
2. Second Step