User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

Appendix B: Performance Verification (AWG710B)
B-12 AWG710&AWG710B Arbitrary Waveform Generator User Manual
12 S1024.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
13 S1024H.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
14 R1024H.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
15 T1024H.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
16 Q1024H.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
17 NULL1024.WFM
(PT_xxxxx.SEQ)
2
1024 400 MHz Through 1 V 0 V Event input
1
The AMPx.SEQ represents AMP1.SEQ and AMP2.SEQ.
2
The PT_xxxxx.SEQ represents PT_EVENT7.SEQ and PT_STROB7.SEQ
Table B-3: Waveforms and sequences in performance check disk (cont.)
No. File name EDIT menu SETUP menu Marker
setup
Usage
Form Points Clock Filter Ampl Offset