User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

Appendix B: Performance Verification (AWG710B)
AWG710&AWG710B Arbitrary Waveform Generator User Manual B-11
Performance
Check/Adjustment Files
Table B-3 lists the sequence and waveform files on the Performance
Check/Adjustment disk that are used in these performance tests, the AWG710B
Arbitrary Waveform Generator front–panel settings that each file sets up, and the
performance test that uses each file.
NOTE. The files on the Performance Check disk are locked (the files are marked
by the icon in the file list), so the data in these files cannot be changed unless
the lock is opened.
Table B-3: Waveforms and sequences in performance check disk
No. File name EDIT menu SETUP menu Marker
setup
Usage
Form Points Clock Filter Ampl Offset
1 MODE.WFM 1000 4 GHz Through 1 V 0 V Marker
1,2: 0 to
499:
High,
500 to
999: Low
Run mode,Trigger level,
Internal trigger accuracy
2 PULSE.WFM 1000 100 MHz Through 1 V 0 V Pulse response
3AMP1.SEQ Amplitude accuracy
(Normal out), Marker
4AMP2.SEQ Amplitude accuracy
(Direct out)
5DC_P.WFM
(AMPx.SEQ)
1
1000 100 MHz Through 1 V 0 V Amplitude accuracy
6DC_M.WFM
(AMPx.SEQ)
1
1000 100 MHz Through 1 V 0 V Amplitude accuracy
7DC0.WFM
(AMP2.SEQ)
1000 100 MHz Through 1 V 0 V Amplitude accuracy
8 OFFSET.WFM 1000 100 MHz Through 20 mV 0 V Offset accuracy
9 TRIG.WFM 1000 1 MHz Through 1 V 0 V Trigger input
10 PT_EVENT7.SEQ
(for AWG710B)
Event input
11 PT_STROB7.SEQ
(for AWG710B)
Event input