User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Getting Started
1-16 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Repackaging for Shipment
If this instrument is shipped by commercial transportation, use the original
packaging material. If the original packaging is unfit for use or is not available,
repackage the instrument as follows:
1. Obtain a corrugated cardboard shipping carton having inside dimensions at
least 3 inches greater than the instrument dimensions and having a carton test
strength of at least 125 kg (275 lb.).
2. If the instrument is being shipped to a Tektronix Service Center for repair or
calibration, attach a tag to the instrument showing the following information:
The owner of the instrument (with address).
The name of a person at your firm who may be contacted if additional
information is needed.
The complete instrument type and serial number.
A description of the service required.
3. Wrap the instrument with polyethylene sheeting or equivalent to protect the
outside finish and prevent entry of packing materials into the instrument.
4. Cushion the instrument on all sides by tightly packing dunnage or urethane
foam between the carton and the instrument, allowing for 7.62 cm (3 in) of
padding on each side (including top and bottom).
5. Seal the carton with shipping tape or with an industrial stapler.
6. Mark the address of the Tektronix Service Center and your return address on
the carton in one or more prominent locations.
NOTE. Do not ship the instrument with a diskette inside the floppy disk drive. When
a diskette is inside the drive, the disk release button sticks out. This makes the
button susceptible to damage.