User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix A: Specifications (AWG710)
AWG710&AWG710B Arbitrary Waveform Generator User Manual A-35
Table A-40: Event Input
Characteristics Description
Connector 9–pin, D type on the rear panel
Number of events 4 bits
Input signal 4 event bits and Strobe
Threshold TTL level
Maximum input 0 V to + 5 V (DC + peak AC)
Impedance 1 kΩ, pull–up to +3.3 V
Enhanced mode
Minimum pulse width 320 clocks + 10 ns
Event hold off time ≤ 896 clocks + 20 ns
Delay to analog out, Typical
(Jump timing: ASYNC) (Output: Norm, Filter: Through)
Strobe: On 1627.5 clocks + 7 ns
Strobe: Off 1883.5 clocks + 5 ns
Event input to strobe input
Setup time 192 clocks + 10 ns
Hold time 192 clocks + 10 ns
Table A-41: 10 MHz reference clock input
Characteristics Description
Input voltage range 0.2 V to 3.0 V
p–p
(into a 50 Ω load, AC coupling)
Maximum ±10 V
Impedance 50 Ω, AC coupling
Reference frequency 10 MHz ±0.1 MHz
Connector Rear panel BNC connector