User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

Appendix A: Specifications (AWG710)
AWG710&AWG710B Arbitrary Waveform Generator User Manual A-31
Table A-35: Filter
(except option 02)
Characteristics Description
Type Bessel low pass filter, 200 MHz,100 MHz, 50 MHz, and 20 MHz
Rise time (10 % to 90 %), Typical 20 MHz
50 MHz
100 MHz
200 MHz
17 ns
7 ns
3.7 ns
2 ns
Group delay, Typical 20 MHz
50 MHz
100 MHz
200 MHz
18 ns
8 ns
4.7 ns
3 ns
Table A-36: Auxiliary outputs
Characteristics Description PV reference page
Marker
4
Number of markers 2 ( Complementary). Marker1, Marker1, Marker2, and Marker2
Level (Hi/Lo) -1.10 V to +3.00 V, into a 50 Ω load
-2.20 V to +6.00 V, into a 1 MΩ load
Maximum Output 2.5 V
p–p
, into a 50 Ω load
Resolution 0.05 V
n Accuracy ±0.1 V ±5 % of setting, into a 50 Ω load Page B-100
Rise and fall times (20 % to 80 %),
Ty p i c a l
150 ps (2 V
p–p
, Hi: +1 V, Lo: -1 V, into a 50 Ω load)
Skew, Typical 70 ps
Period jitter, Typical Measured by TDS694C with options 1M and HD and TDSJIT1.
Refer to Table A-37.
Cycle to cycle jitter, Typical Measured by TDS694C with options 1M and HD and TDSJIT1.
Refer to Table A-38.
Connector Front panel SMA connectors
1/4 Clock output
Level ECL 100 K compatible (internally loaded in 50 Ω to -2 V and 47 Ω series terminated)
Period jitter, Typical Measured by TDS694C with options 1M and HD and TDSJIT1.
Refer to Table A-37.
Cycle to cycle jitter, Typical Measured by TDS694C with options 1M and HD and TDSJIT1.
Refer to Table A-38.
Connector Rear panel SMA connector