User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix A: Specifications (AWG710B)
A-10 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Figure A-2: Gated Mode
1. After RUN starting, Gate signal is input
PW
min
: 1152 clocks + 10 ns
(1355 to 1563.5) clocks + 9 ns at 4 GS/s
Gate Signal
The interval of Output is equal to PW
min
The only interval of 1st Output is equal to PW
min
and the others are normal.
1-1. The interval of Gate signal is longer than PW
min
(Minimum Pulse Width) x 2
Interval = PW
min
x 2
Analog output
RUN start point
T > PW
min
x 2
Delay to Analog output
1-2. The interval of Gate signal is equal to PW
min
(Minimum Pulse Width) x 2
Gate Signal
Analog output
PW
min
PW
min
2. Before RUN starting, Gate signal is input
2-1. The interval of Gate signal is longer than PW
min
(Minimum Pulse Width) x 2
RUN start point
Gate Signal
Analog output
PW
min
Delay to Analog output
PW
min
2-2. The interval of Gate signal is equal to PW
min
(Minimum Pulse Width) x 2
As above 1-2, the interval of Analog Output is equal to PW
min
.