User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Appendix A: Specifications (AWG710B)
AWG710&AWG710B Arbitrary Waveform Generator User Manual A-3
Sequence counter 1 to 65 536 and Infinite
Waveform data points Multiple of 4 in the range from 960 to 32 400 000 points
Op.01 Multiple of 4 in the range from 960 to 64 800 000 points
Data storage
Hard disk ≥20 G bytes
Floppy disk 1.44 M bytes
Table A-3: Arbitrary waveforms
Characteristics Description
Table A-4: Clock generator
Characteristics Description PV reference page
Sampling frequency 50.000 000 kHz/s to 4.200 000 0 GHz/s
Resolution 8 digits
Internal clock
1
Page B-48n Frequency accuracy ±1 ppm (10 °C to 40 °C), during 1 year after calibration
Phase noise at VCO output,
Ty p i c a l
-65 dBc / Hz (4.2 GS/s with 10 kHz offset)
-96 dBc / Hz (4.2 GS/s with 100 kHz offset)
1
The internal reference oscillator is used.
Table A-5: Internal trigger generator
Characteristics Description PV reference page
Internal trigger rate
2
±0.1 %Accuracy
Range 1.0 µs to 10.0 s
Resolution 3 digits, minimum 0.1 µs
2
The internal reference oscillator is used.
Table A-6: Main output
Characteristics
3
Description PV reference page
Output connector front–panel SMA connectors
Output signal Complemental; CH1 and CH1
DA converter
Resolution 8 bits