User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

AWG710&AWG710B Arbitrary Waveform Generator User Manual A-1
Appendix A: Specifications (AWG710B)
This section contains the AWG710B Arbitrary Waveform Generator specifications.
All specifications are guaranteed unless labeled “typical”. Typical specifications
are provided for your convenience but are not guaranteed.
Specifications that are marked with the
n symbol in the column Characteristics
are checked in Appendix B: Performance Verification and the page number
referenced to the corresponding performance verification procedures can be found
in the column PV reference page.
The characteristics in the specifications are listed in tables that are divided into
categories. In these tables, the subcategories may also appear in boldface under the
column Characteristics.
Performance Conditions
The performance limits in this specification are valid with these conditions:
The AWG710B Arbitrary Waveform Generator must have been
calibrated/adjusted at an ambient temperature between +20
° C and +30° C.
The AWG710B Arbitrary Waveform Generator must be in an environment
with temperature, altitude, humidity, and vibration within the operating limits
described in these specifications.
The AWG710B Arbitrary Waveform Generator must have had a warm–up
period of at least 20 minutes.
The AWG710B Arbitrary Waveform Generator must be operating at an
ambient temperature between +10
° C and +40° C.
Warranted characteristics are described in terms of quantifiable performance limits
which are warranted.