User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
FG Mode
3-238 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Marker signal
Marker1 and Marker2 signals are generated and output from MARKER OUT1,
MARKER OUT1
, MARKER OUT2 and MARKER OUT2 connectors. The
waveform marker signal has the same form as a pulse waveform. The level and
width of the markers are fixed and cannot be changed. Table 3-55 describes the
marker specification. Marker width depends on the output frequency. Refer to
Table 3-56 on page 3-239.
Figure 3-80: Marker pattern
Table 3-55: Predefined Marker signal
Waveform Hi Low Level
Marker1 0 (phase = 0 deg.) to 20 % of
one period of waveform
20 to 100 % of one period of
waveform
Hi :
2.0 V:AWG710
1.0 V :AWG710B
Low : 0.0V
Marker2 0 (phase = 0 deg.) to 50 % of
one period of waveform
Frequency: 100.1MHz to
160.0MHz
0 (phase = 0 deg.) to 52 % of
one period of waveform
50 to 100 % of one period of
waveform
52 to 100 % of one period of
waveform
Hi :
2.0 V :AWG710
1.0 V :AWG710B
Low : 0.0V