User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Programming Examples
3-216 AWG710&AWG710B Arbitrary Waveform Generator User Manual
size = 1000
clock = 1e8
num = 4
' Sub-sequence
write("SUBSEQ.SEQ", "MAGIC 3002A\n")
write("SUBSEQ.SEQ", "LINES ":num:"\n")
write("SUBSEQ.SEQ", "\"SQUARE.WFM\",\"\",40000\n")
write("SUBSEQ.SEQ", "\"RAMP.WFM\",\"\",60000\n")
write("SUBSEQ.SEQ", "\"TRIANGLE.WFM\",\"\",60000\n")
write("SUBSEQ.SEQ", "\"SINE.WFM\",\"\",30000\n")
' Main sequence
write("MAINSEQ.SEQ", "MAGIC 3002A\n")
write("MAINSEQ.SEQ", "LINES ":num:"\n")
write("MAINSEQ.SEQ", "\"SUBSEQ.SEQ\",\"\",2,1,0,0\n")
write("MAINSEQ.SEQ", "\"RAMP.WFM\",\"\",0,0,0,-1,0\n")
write("MAINSEQ.SEQ", "\"TRIANGLE.WFM\",\"\",40000,0,0,4,1\n")
write("MAINSEQ.SEQ", "\"SINE.WFM\",\"\",60000,0,0,0,0\n")
write("MAINSEQ.SEQ", "TABLE_JUMP
0,0,0,0,0,0,0,0,0,0,0,0,0,0,0,0,\n")
write("MAINSEQ.SEQ", "LOGIC_JUMP -1,-1,-1,-1,\n")
write("MAINSEQ.SEQ", "JUMP_MODE LOGIC\n")
write("MAINSEQ.SEQ", "JUMP_TIMING ASYNC\n")
write("MAINSEQ.SEQ", "STROBE 0\n")
' Standard functions
"GAUSSN.WFM" = noise()
"SINE.WFM" = sin(2 * pi * scale)
"RAMP.WFM" = 2 * scale -1
"TRIANGLE.WFM" = tri(2 * pi * scale)
"SQUARE.WFM" = sqr(2 * pi * scale)
See Figure 2-45 on page 2-75 to see the contents of the subseq.seq file, and
Figure 2-49 on page 2-80 to see the contents of the mainseq.seq file.
Figure 3-70 on page 3-217 shows the gaussn.wfm and ramp.wfm waveforms
created in above equation.
Refer to Appendix G: Sequence File Text Format for more information.