User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
Programming Examples
3-214 AWG710&AWG710B Arbitrary Waveform Generator User Manual
The waveforms generated by the previous equation file are composed of 0 and 1.
It is convenient to use the waveform editor in table mode to look at the results.
Refer to Code Conversion on page F-7 for the input patterns, output patterns and
code conversion tables.
Example 7
The following example applies a 7–point smoothing operation to a noise
waveform. This equation uses the extract(), integ() and join() functions, and also
for and if control statements. Although you do not have any other method to
perform smoothing with the instrument, this is not a preferable way to apply a
smoothing operation. Refer to this example for learning how to use these functions
and control statements.
You can change the number of smoothing points by changing the value of the
variable nump. The greater the value of nump, the faster the instrument can finish
the compile. However, this kind of program frequently accesses the hard disk and
takes more than 20 minutes to complete.
' Simple smoothing (7 points)
nump = 7
extp = nump - 1
nsht = extp / 2
size = 960
"NOISE.WFM" = noise()
"NOISE.WFM" = norm("NOISE.WFM")
cc = 1
for i = nsht to (size - nsht -1) step 1
sp = i - nsht
ep = i + nsht
"TEMP1.WFM" = extract("NOISE.WFM", sp, ep)
"TEMP1.WFM" = integ("TEMP1.WFM")
"TEMP2.WFM" = extract("TEMP1.WFM", extp, extp)
"TEMP2.WFM" = "TEMP2.WFM" / nump
if cc = 1 then
"SMOOTH.WFM" = "TEMP2.WFM"
else
"SMOOTH.WFM" = join("SMOOTH.WFM", "TEMP2.WFM")
endif
cc = cc + 1
next
delete("TEMP1.WFM")
delete("TEMP2.WFM")