User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

The UTILITY Window
AWG710&AWG710B Arbitrary Waveform Generator User Manual 3-177
Sequence memory 5000 Sequence memory test error
5100 Data bus test error
5101 to 5132 Data bus test error (bit 0 to bit 31)
5200 Address bus test error
5201 to 5216 Address bus test error (bit 0 to bit 15)
5300 Chip cell test error
5301 to 5302 Chip cell test error (chip 0 to chip 1)
5350 Chip select test error
5351 to 5352 Chip select test error (chip select 0 to chip
select 1)
Waveform memory CH1 6000 Waveform memory test error
6100 Data bus test error
6101 to 6132 Data bus test error (bit 0 to bit 31)
6150 Chip data bus test error
6151 to 6186 Chip data bus test error (chip 0 to chip 31)
6200 Address bus test error
6201 to 6219 Address bus test error (bit 0 to bit 18)
6300 Chip cell test error
6301 to 6336 Chip cell test error (chip 0 to chip 35)
6350 Chip select test error
6351 to 6386 Chip select test error (chip select 0 to chip
select 35)
Output 7000 Output test error
7100 Internal offset device test error
7101 to 7104 Internal offset device test error (CH1 to
CH1
)
7200 Output offset device test error
7201 to 7204 Output offset device test error (CH1 to CH1
)
7300 ARB gain test error
7301 to 7304 ARB gain test error (CH1 to CH1
)
7400 Direct gain test error
7401 to 7404 Direct gain test error (CH1 to CH1
)
7510 5dB attenuator 1 test error
Table 3-45: Diagnostic categories and error codes (cont.)
Categories Error codes Descriptions