User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index

The UTILITY Window
AWG710&AWG710B Arbitrary Waveform Generator User Manual 3-175
An error in the digital to analog converter (DAC) may be reported if you do not
execute the system calibration at power–on.
See Table 3-45 for the test categories and error codes.
Manual Diagnostics
The manual diagnostics routines can execute a full set of hardware tests for all the
test categories or only for the specified category except for the DAC. You can also
specify a test cycle of 1 to infinite times.
Do the following steps to execute the diagnostics:
1. Push the RUN button to turn the output off if a waveform is being output.
The RUN LED turns off.
2. Push UTILITY (front–panel)!Diag (bottom).
The screen shown in Figure 3-59 appears.
3. Push the Diagnostic xxxx side button and select a test category by using the
general purpose knob.
The xxxx represents currently selected test category. You can select a test
category from All, System, Run Mode, Clock, Output, Seq Mem and Wave
Mem. If you select All, the diagnostic routines of all categories are executed.
4. Push the Cycle n side button and select a test cycle by using the general
purpose knob.
The n represents a currently selected test cycle. You can select a test cycle from
1, 3, 10, 100 or Infinite. If you select Infinite, the diagnostic tests are repeated
infinitely. Push the Abort Diagnostic side button to stop the execution.
5. Push the Execute Diagnostic side button to start the diagnostic tests.
The
– – – is displayed at each test category on the screen either at the beginning or
after the factory reset. The mark
– – – is also displayed while the diagnostic test is
executing. See Figure 3-60. When the diagnostic test terminates without error, Pass
is displayed instead of the
– – –. The test routine displays the error code and skips
to the next test if an error is detected.
See Table 3-45 for the test categories and error codes.
NOTE. When you execute the Waveform memory self test, it takes 1.5 minutes for
standard type, 3 minutes for option 01.