User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
The APPL Menu
3-144 AWG710&AWG710B Arbitrary Waveform Generator User Manual
Line Code Conversion
Line code conversion inputs the binary bit pattern and converts the transition from
1 to 0 or 0 to 1 to a positive or negative pulse. Table 3-39 lists the standard defined
code conversions.
Isolated Pulse
The standard–defined isolated pulse is used. You do not need to set a pulse.
When the Line Code is a AMI standard (ITU-T E1, E2, E3, T1.102 DS1, DS1A,
DS1C, DS2, DS3, STS-T), an user defined waveform file can be used as an isolated
pulse. The length of isolated pulse has no restriction.
Table 3-38: Pre–defined patterns
Pattern items Descriptions
PN9 9–bits M–series pseudo random pulse
PN15 15–bits M–series pseudo random pulse
0000
1111
100100
10001000
1000010000
100000100000
1000000010000000
1111100000
Table 3-39: Code conversion
Code conversion Descriptions
CMI (Code Mark Inversion) Last level: Low
Level of the last binary 1: High
B6ZS, B8ZS (Bipolar with Eight
Zero Substitution)
Polarity of the last pulse: Negative
Number of successive 0: 0
B3ZS, HDB3
(High Density Bipolar 3)
Polarity of the last pulse: Negative
Number of successive 0: 0
Number of B pulse: 1
MLT–3
(High Density Bipolar 3)
Initial level: 0,
First output nonzero level: 1