User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
AWG710&AWG710B Arbitrary Waveform Generator User Manual 3-131
The APPL Menu
The following applications are in the APPL menu:
Disk application
Network application
Jitter composer
These applications are used like an editor to generate a waveform for specific
purposes.
Disk Application
Using this application, you can easily create test signals for reading or writing data
from/to hard disk media.
Signals are created using the following process:
Input binary bit pattern expressed by 0 and 1.
Convert the input pattern and estimate the positions of the generated pulse and
polarity.
Superpose an isolated pulse in the position estimated above. The pulses shift
during superpose.
Figure 3-34: Outline flow for producing HDD reading test signal
Isolated pulse
Code
Conversion
Input data Output