User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
The Sequence Editor
AWG710&AWG710B Arbitrary Waveform Generator User Manual 3-129
Figure 3-33: Compiling and storing sequences and subsequences
Defining subsequence calls with large repeat counts can generate internal code that
consumes a large amount of sequence memory. This can result in insufficient
memory errors. The AWG710&AWG710B Arbitrary Waveform Generator does
not check for sequence memory availability errors. If you load a sequence and the
AWG710&AWG710B Arbitrary Waveform Generator displays a memory error
message, you need to reduce the number of subsequence calls, the number of repeat
counts, and/or the number of lines in the subsequences.
BK1.WFM Repeat 6
BK7.WFM Repeat 2
BK5.WFM Repeat 3
•••
BK7.WFM Repeat 2
BK5.WFM Repeat 3
BK2.WFM Repeat 1
BK+7.WFM Repeat 2
BK5.WFM Repeat 3
•••
BK7.WFM Repeat 2
BK5.WFM Repeat 3
BK3.PAT Repeat 4
BK7.WFM Repeat 2
BK5.WFM Repeat 3
•••
BK7.WFM Repeat 2
BK5.WFM Repeat 3
BK1.WFM 6
SUB8.SEQ 25
BK2.WFM 1
SUB8.SEQ 15
BK3.PAT 4
SUB8.SEQ 5
BK7.WFM 2
BK5.WFM 3
25 times
15 times
5 times
Subsequence: SUB8.SEQ
Compile
Subsequence call
Sequence:
Sequence and subsequence example
Suppose that the waveform file: BK1.WFM,,
BK2.WFM, BK3.PAT, BK5.WFM and
BK7.WFM has been created in the
waveform memory.
Internal code image in
the sequence memory