Data Sheet

Reduce development time with ready-to-use, built-in applications

The Double Pulse Test on the AFG31000 offers the design and test

engineer the ability to generate voltage pulses with varying pulse widths

onto their DUTs. The design and test engineers are able to perform the

Double Pulse Test in less than one minute, saving them hours when

compared to using a PC software or a microcontroller to perform the

test with varying configurations.

Typical applications

• R&D engineer and test engineer of semiconductor industry (power

device and power module with SiC/GaN/Si)

• Automotive industry (EV, EHV, FCV), laboratory and university of

power electronics

• Power device manufacturer

• Heavy user of power device and module

• Inverter and motor drive system

Upgradability protects your investment

The AFG31000 provides upgrade options for bandwidth, memory

extension, and sequence mode support. These options can be installed

at the factory or at any time after purchase. This upgradability helps to

reduce the product ownership threshold. And when your test

requirements change, you can purchase and install upgrade software

licenses to add higher performance features. Upgrades eliminate the

concern about the return on investment during the instrument lifetime.

AFG31000 Series Datasheet