User's Manual

6
4 Reliability Test
NO Test Item Test condition Test result
1
TCT
(Operating)
a) Power on
b) Vin = working voltage
c) -10℃ to 60℃
d) Duration of exposure –10℃ & 60℃ at
least 5mins.
e) Ramp rate 2.3 ℃/mins or less.
f) Power on/off 2,000 times (applicable to
new module project with EEPROM or
ECN related to EEPROM.)
g) 30 cycles, samples: 6pcs
Pass
2
LTST
(Operating)
a) Power on.
b) Vin = working voltage
c) Operation at –10℃.
d) 72hrs, samples: 6pcs
Pass
3
HTST
(Operating)
a) Power on.
b) Vin = working voltage
c) Operation at 60℃.
d) 72hrs, samples: 6pcs
Pass
4
THB
(Operating)
a) Power on.
b) Vin = working voltage
c) Operation at 40℃/90%RH~95%RH.
d) 72hrs, samples: 6pcs
Pass
5
HTOL
(Operating)
a) Just Power on Module，No Pairing with RX
b) Vin = working voltage
c) Operation at 85℃
d) 96hrs, samples:50pcs
Pass
6
TST
(Storage)
a) No DC input to Module
b) -10℃ to 60℃, Ramp rate 5℃/mins or less
c) Duration of exposure at least 5mins.
d) 30 cycles, samples: 22pcs
Pass
7
LTST
(Storage)
a) No DC input to Module
b) Storage Temp: -20℃
c) 300hrs, samples: 22pcs
Pass
8
HTST
(Storage)
a) No DC input to Module
b) Storage Temp: +85℃
c) 300hrs, samples: 22pcs
Pass