Datasheet

Electrical specifications VNH5180A-E
12/31 Doc ID 17074 Rev 6
Figure 4. Definition of the delay times measurement
I
SENSE0
Analog sense
leakage current
I
OUT
= 0 A; V
SENSE
=0V; V
CSD
=5V;
V
IN
=0V; T
j
= - 40 to 150 °C
05µA
V
CSD
=0V; V
IN
=5V;
T
j
= - 40 to . 150 °C
0 180 µA
V
CSD
=5V; V
IN
=5V; I
OUT
= 2.5 A;
T
j
= - 40 to . 150 °C
05µA
t
DSENSEH
Delay response time
from falling edge of
CS_DIS pin
V
IN
=5V; V
SENSE
<4V, I
OUT
=2.5A,
I
SENSE
=90% of I
SENSEmax
(see Figure 8)
50 µs
t
DSENSEL
Delay response time
from rising edge of
CS_DIS pin
V
IN
=5V; V
SENSE
<4V; I
OUT
=2.5A;
I
SENSE
=10% of I
SENSEmax
(see Figure 8)
20 µs
1. Analog sense current drift is deviation of factor K for a given device over (-40 °C to 150 °C and
9V < V
CC
< 18 V) with respect to its value measured at T
J
= 25 °C, V
CC
= 13 V.
Table 12. Current sense (9 V < V
CC
< 18 V) (continued)
Symbol Parameter Test conditions Min. Typ. Max. Unit
t
t
V
INB
V
INA
t
PWM
t
I
LOAD
t
DEL
t
DEL