Datasheet

Table Of Contents
TSV521, TSV522, TSV524, TSV521A, TSV522A, TSV524A Application information
Doc ID 022743 Rev 1 17/27
For the operational amplifier, a follower stress condition is used for the reliability evaluation,
with V
CC
defined in function of the Maximum operating voltage and the absolute maximum
rating (as recommended by the JEDEC standards).
The V
io
drift, in µV, of the product after 1000 h duration of stress is tracked with parameters
at different measurement conditions, as for example:
Equation 6
V
CC
= max. V
op
with V
icm
=V
CC
/2
Finally, knowing the calculated number of months and with the measured drift value of the
V
io
(corresponding to the electrical characteristics of the respective table) after 1000 h
duration of stress, the ratio of the V
io
drift over the square of months,
Δ
V
io
in µV/month, is
defined as the long term drift parameter, the parameter estimating the reliability
performance of the product.
Equation 7
ΔV
io
= V
io
drift / (months)
4.8 PCB layouts
For correct operation, it is advised to add 10 nF decoupling capacitors as close as possible
to the power supply pins.
4.9 Macromodel
Accurate macromodels of the TSV52x device are available on STMicroelectronics™ website
at www.st.com. This model is a trade-off between accuracy and complexity (that is, time
simulation) of the TSV52x operational amplifiers. It emulates the nominal performance of
a typical device within the specified operating conditions mentioned in the datasheet. It also
helps to validate a design approach and to select the appropriate operational amplifier, but it
does not replace onboard measurements.