Datasheet

Application information TSV521, TSV522, TSV524, TSV521A, TSV522A, TSV524A
16/27 Doc ID 022743 Rev 1
4.7 Long term input offset voltage drift
In a product reliability evaluation, two types of stress acceleration are usable:
● Voltage acceleration, by changing the applied voltage
● Temperature acceleration, by changing the die temperature (below the maximum
junction temperature allowed by the technology) with the ambient temperature
The voltage acceleration has been defined based on JEDEC results, and is defined by:
Equation 2
where:
A
FV
is the voltage acceleration factor
ß is the voltage acceleration constant in 1/V, constant technology parameter
V
S
is the stress voltage used for the accelerated test
V
U
is the use voltage for the application
The temperature acceleration is driven by the Arrhenius model, and is defined by:
Equation 3
where:
A
FT
is the temperature acceleration factor
E
a
is the activation energy of the technology based on failure rate
k is the Boltzmann’s constant
T
U
is the temperature of the die when V
U
is used
T
S
is the temperature of the die under temperature stress
The final acceleration factor, A
F
, is the multiplication of these two acceleration factors, which
is:
Equation 4
A
F
= A
FT
x A
FV
Based on this A
F
, calculated following the defined usage temperature and usage voltage of
the product, the 1000 h duration of the stress corresponds to a number of equivalent months
of usage.
Equation 5
Months = A
F
x 1000 h x 12 months / (24h x 365.25 days)
A
FV
e
β V
S
V
U
–()⋅
=
A
FT
e
E
a
k
------
1
T
U
------
1
T
S
------–
⎝⎠
⎛⎞
⋅
=