Datasheet

Figure 45: ADC accuracy characteristics
1. Example of an actual transfer curve.
2. The ideal transfer curve
3. End point correlation line
E
T
= Total unadjusted error: maximum deviation between the actual and the ideal transfer
curves.
E
O
= Offset error: deviation between the first actual transition and the first ideal one.
E
G
= Gain error: deviation between the last ideal transition and the last actual one.
E
D
= Differential linearity error: maximum deviation between actual steps and the ideal
one.
E
L
= Integral linearity error: maximum deviation between any actual transition and the end
point correlation line.
Figure 46: Typical application with ADC
STM8
10-bit A/D
conversion
R
AIN
C
AIN
V
AIN
AINx
V
DD
V
T
0.6 V
V
T
0.6 V
I
L
± 1 µA
C
ADC
EMC characteristics10.3.12
Susceptibility tests are performed on a sample basis during product characterization.
99/124DocID14771 Rev 12
Electrical characteristicsSTM8S105xx