Datasheet

Electrostatic discharge (ESD)10.3.12.5
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied
to the pins of each sample according to each pin combination. The sample size depends on
the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Table 50: ESD absolute maximum ratings
UnitMaximum
value
(1)
ClassConditionsRatingsSymbol
V2000AT
A
= +25°C,
conforming to
JESD22-A114
Electrostatic discharge
voltage (Human body model)
V
ESD(HBM)
V1000IVT
A
=+25°C, conforming
to JESD22-C101
Electrostatic discharge
voltage (Charge device
model)
V
ESD(CDM)
(1)
Data based on characterization results, not tested in production
Static latch-up10.3.12.6
Two complementary static tests are required on 10 parts to assess the latch-up performance:
•
A supply overvoltage (applied to each power supply pin)
•
A current injection (applied to each input, output and configurable I/O pin) are performed
on each sample.
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Table 51: Electrical sensitivities
Class
(1)
ConditionsParameterSymbol
AT
A
= +25 °CStatic latch-up classLU
AT
A
= +85 °C
AT
A
= +125 °C
(1)
Class description: A Class is an STMicroelectronics internal specification. All its limits
are higher than the JEDEC specifications, that means when a device belongs to class A it
exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international
standard).
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STM8S105xxElectrical characteristics