Datasheet

DocID15962 Rev 13 85/131
STM8L151xx, STM8L152xx Electrical parameters
112
9.3.6 I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
SS
or
above V
DD
(for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error, out of spec current
injection on adjacent pins or other functional failure (for example reset, oscillator frequency
deviation, LCD levels, etc.).
The test results are given in the following table.
9.3.7 I/O port pin characteristics
General characteristics
Subject to general operating conditions for V
DD
and T
A
unless otherwise specified. All
unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or
an external pull-up or pull-down resistor.
Table 37. I/O current injection susceptibility
Symbol Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
I
INJ
Injected current on true open-drain pins (PC0 and
PC1)
-5 +0
mA
Injected current on all five-volt tolerant (FT) pins -5 +0
Injected current on all 3.6 V tolerant (TT) pins -5 +0
Injected current on any other pin -5 +5