Datasheet

Electrical parameters STM8L151x2, STM8L151x3
94/112 Doc ID 018780 Rev 4
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm IEC61967-2 which specifies the board and the loading of each pin.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Table 50. EMS data
Symbol Parameter Conditions
Level/
Class
V
FESD
Voltage limits to be applied on
any I/O pin to induce a functional
disturbance
V
DD
= 3.3 V, T
A
= +25 °C,
f
CPU
= 16 MHz,
conforms to IEC 61000
2B
V
EFTB
Fast transient voltage burst limits
to be applied through 100 pF on
V
DD
and V
SS
pins to induce a
functional disturbance
V
DD
= 3.3 V, T
A
= +25 °C,
f
CPU
= 16 MHz,
conforms to IEC 61000
Using HSI
4A
Using HSE 2B
Table 51. EMI data
(1)
1. Not tested in production.
Symbol Parameter Conditions
Monitored
frequency band
Max vs.
Unit
16 MHz
S
EMI
Peak level
V
DD
= 3.6 V,
T
A
= +25 °C,
LQFP48
conforming to
IEC61967-2
0.1 MHz to 30 MHz -3
dBμV30 MHz to 130 MHz 9
130 MHz to 1 GHz 4
SAE EMI Level 2 -