Datasheet

STM8L151x2, STM8L151x3 Electrical parameters
Doc ID 018780 Rev 4 93/112
Figure 41. Max. dynamic current consumption on V
REF+
supply pin during ADC
conversion
7.3.13 EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Functional EMS (electromagnetic susceptibility)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electromagnetic events until a failure occurs (indicated by the
LEDs).
● ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test conforms with the IEC 61000 standard.
● FTB: A burst of fast transient voltage (positive and negative) is applied to V
DD
and V
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test conforms
with the IEC 61000 standard.
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
A
DC clock
Sampling
(n cycles)
Conversion (12 cycles)
I
ref+
300μA
700μA
MS18181V1
Table 49. R
AIN
max for f
ADC
= 16 MHz
t
S
(cycles)
t
S
(µs)
R
AIN
max (kohm)
Slow channels Fast channels
2.4 V < V
DDA
< 3.6 V 1.8 V < V
DDA
< 2.4 V 2.4 V < V
DDA
< 3.3 V 1.8 V < V
DDA
< 2.4 V
4 0.25 Not allowed Not allowed 0.7 Not allowed
9 0.5625 0.8 Not allowed 2.0 1.0
16 1 2.0 0.8 4.0 3.0
24 1.5 3.0 1.8 6.0 4.5
48 3 6.8 4.0 15.0 10.0
96 6 15.0 10.0 30.0 20.0
192 12 32.0 25.0 50.0 40.0
384 24 50.0 50.0 50.0 50.0