Datasheet

Functional overview STM8L15xx8, STM8L15xR6
20/134 DocID17943 Rev 6
3.9 Analog-to-digital converter
• 12-bit analog-to-digital converter (ADC1) with 28 channels (including 4 fast channel),
temperature sensor and internal reference voltage
• Conversion time down to 1 µs with f
SYSCLK
= 16 MHz
• Programmable resolution
• Programmable sampling time
• Single and continuous mode of conversion
• Scan capability: automatic conversion performed on a selected group of analog inputs
• Analog watchdog: interrupt generation when the converted voltage is outside the
programmed threshold
• Triggered by timer
Note: ADC1 can be served by DMA1.
3.10 Digital-to-analog converter
• 12-bit DAC with 2 buffered outputs (two digital signals can be converted into two analog
voltage signal outputs)
• Synchronized update capability using timers
• DMA capability for each channel
• External triggers for conversion
• Noise-wave generation
• Triangular-wave generation
• Dual DAC channels with independent or simultaneous conversions
• Input reference voltage V
REF+
for better resolution
Note: DAC can be served by DMA1.
3.11 Ultralow power comparators
The high density and medium+ density STM8L15xx devices embed two comparators
(COMP1 and COMP2) sharing the same current bias and voltage reference. The voltage
reference can be internal or external (coming from an I/O).
• One comparator with fixed threshold (COMP1).
• One comparator rail to rail with fast or slow mode (COMP2). The threshold can be one
of the following:
– DAC output
– External I/O
– Internal reference voltage or internal reference voltage submultiple (1/4, 1/2, 3/4)
The two comparators can be used together to offer a window function. They can wake up
from Halt mode.