Datasheet

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STM32L151x6/8/B, STM32L152x6/8/B Electrical characteristics
105
dOffset/dT
(1)
Offset error temperature
coefficient (code 0x800)
V
DDA
= 3.3V, V
REF+
= 3.0V
T
A
= 0 to 50 °C
DAC output buffer OFF
-20 -10 0
µV/°C
V
DDA
= 3.3V, V
REF+
= 3.0V
T
A
= 0 to 50 °C
DAC output buffer ON
020 50
Gain
(1)
Gain error
(7)
C
L
≤ 50 pF, R
L
≥ 5 kΩ
DAC output buffer ON
-
+0.1 /
-0.2%
+0.2 / -0.5%
%
No R
LOAD
, C
L
≤ 50 pF
DAC output buffer OFF
- +0 / -0.2% +0 / -0.4%
dGain/dT
(1)
Gain error temperature
coefficient
V
DDA
= 3.3V, V
REF+
= 3.0V
T
A
= 0 to 50 °C
DAC output buffer OFF
-10 -2 0
µV/°C
V
DDA
= 3.3V, V
REF+
= 3.0V
T
A
= 0 to 50 °C
DAC output buffer ON
-40 -8 0
TUE
(1)
Total unadjusted error
C
L
≤ 50 pF, R
L
≥ 5 kΩ
DAC output buffer ON
-12 30
LSB
No R
LOAD
, C
L
≤ 50 pF
DAC output buffer OFF
-8 12
t
SETTLING
Settling time (full scale:
for a 12-bit code
transition between the
lowest and the highest
input codes till
DAC_OUT reaches final
value ±1LSB
C
L
≤ 50 pF, R
L
≥ 5 kΩ -7 12µs
Update rate
Max frequency for a
correct DAC_OUT
change (95% of final
value) with 1 LSB
variation in the input
code
C
L
≤ 50 pF, R
L
≥ 5 kΩ - - 1 Msps
t
WAKEUP
Wakeup time from off
state (setting the ENx bit
in the DAC Control
register)
(8)
C
L
≤ 50 pF, R
L
≥ 5 kΩ -9 15µs
PSRR+
V
DDA
supply rejection
ratio (static DC
measurement)
C
L
≤ 50 pF, R
L
≥ 5 kΩ - -60 -35 dB
1. Data based on characterization results.
2.
Connected between DAC_OUT and V
SSA
.
3. Difference between two consecutive codes - 1 LSB.
4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code 4095.
Table 57. DAC characteristics (continued)
Symbol Parameter Conditions Min Typ Max Unit