Datasheet

STM32L100C6, STM32L100R8/RB Electrical characteristics
DocID024295 Rev 1 89/102
Gain
(1)
Gain error
(7)
C
L
≤ 50 pF, R
L
≥ 5 kΩ
DAC output buffer ON
+0.1 / -0.2% +0.2 / -0.5%
%
No R
LOAD
, C
L
≤ 50 pF
DAC output buffer OFF
+0 / -0.2% +0 / -0.4%
dGain/dT
(1)
Gain error temperature
coefficient
V
DDA
= 3.3V
T
A
= 0 to 50 ° C
DAC output buffer OFF
-10 -2 0
µV/°C
V
DDA
= 3.3V
T
A
= 0 to 50 ° C
DAC output buffer ON
-40 -8 0
TUE
(1)
Total unadjusted error
C
L
≤ 50 pF, R
L
≥ 5 kΩ
DAC output buffer ON
12 30
LSB
No R
LOAD
, C
L
≤ 50 pF
DAC output buffer OFF
812
t
SETTLING
Settling time (full scale: for
a 12-bit code transition
between the lowest and
the highest input codes till
DAC_OUT reaches final
value ±1LSB
C
L
≤ 50 pF, R
L
≥ 5 kΩ 712µs
Update rate
Max frequency for a
correct DAC_OUT change
(95% of final value) with 1
LSB variation in the input
code
C
L
≤ 50 pF, R
L
≥ 5 kΩ 1 Msps
t
WAKEUP
Wakeup time from off
state (setting the ENx bit
in the DAC Control
register)
(8)
C
L
≤ 50 pF, R
L
≥ 5 kΩ 915µs
PSRR+
V
DDA
supply rejection ratio
(static DC measurement)
C
L
≤ 50 pF, R
L
≥ 5 kΩ -60 -35 dB
1. Data based on characterization results.
2. Connected between DAC_OUT and V
SSA
.
3. Difference between two consecutive codes - 1 LSB.
4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and
last Code 4095.
5. Difference between the value measured at Code (0x800) and the ideal value = V
DDA
/2.
6. Difference between the value measured at Code (0x001) and the ideal value.
7. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and
0xFFF when buffer is OFF, and from code giving 0.2 V and (V
DDA
– 0.2) V when buffer is ON.
8. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).
Table 55. DAC characteristics (continued)
Symbol Parameter Conditions Min Typ Max Unit