Datasheet

STM32L100C6, STM32L100R8/RB Electrical characteristics
DocID024295 Rev 1 47/102
1. Tested in production.
2. The internal V
REF
value is individually measured in production and stored in dedicated EEPROM bytes.
3. Guaranteed by design, not tested in production.
4. Shortest sampling time can be determined in the application by multiple iterations.
5. To guarantee less than 1% VREF_OUT deviation.