Datasheet

DocID022691 Rev 4 127/131
STM32F37xxx Revision history
130
9 Revision history
Table 82. Document revision history
Date Revision Changes
18-Jun-2012 1 Initial release.
07-Sep-2012 2
Added ‘F’ to all ‘Cortex-M4’ occurences
Modified the shapes of Figure 2: STM32F373x LQFP48
pinout to Figure 4: STM32F373x LQFP100 pinout
Added two rows ‘VREFSD+ - VDDSD3’ and ‘VREF+ - VDDA’
in Table 19: Voltage characteristics
Removed PB0 in footnote of Table 19: Voltage characteristics
and in Section 6.3.14: I/O port characteristics
Added a paragraph after ‘...power up sequence’ in
Section 6.2: Absolute maximum ratings and after ‘...in output
mode’ in I/O system current consumption
Corrected SDAC_VREF+ in Figure 9: Power supply scheme
Modified Table 20: Current characteristics
Added BGA100 in Table 22: General operating conditions
Added values in Table 27: Embedded internal reference
voltage
Filled values in Table 28: Typical and maximum current
consumption from VDD supply at VDD = 3.6 V
Filled values in Table 29: Typical and maximum current
consumption from VDDA supply
Filled values in Table 30: Typical and maximum VDD
consumption in Stop and Standby modes
Removed table: “Typical and maximum VDDA consumption in
Stop modes”
Filled values in Table 31: Typical and maximum VDDA
consumption in Stop and Standby modes
Added VBAT values in Table 32: Typical and maximum
current consumption from VBAT supply
Added typ values in Table 33: Typical current consumption in
Run mode, code with data processing running from Flash and
Table 34: Typical current consumption in Sleep mode, code
running from Flash or RAM
Added max value in Table 41: LSE oscillator characteristics
(fLSE = 32.768 kHz)
Modified min and max values in Table 42: HSI oscillator
characteristics
Added values in Table 37: Low-power mode wakeup timings
Added Class values in Table 47: EMS characteristics
Modified values in Table 48: EMI characteristics
Added values in Table 49: ESD absolute maximum ratings
Added class value in Table 50: Electrical sensitivities
Modified values and descriptions in Table 51: I/O current
injection susceptibility