Datasheet

DocID023353 Rev 7 131/133
STM32F303xB STM32F303xC Revision history
132
05-Dec-2012 4
Updated first page
Removed references to VDDSDx and VSSSD
Added reference to PM0214 in Section 1
Moved Temp. sensor calibartion values toTab le 74 and VREF
calibration values to Table 27
Updated Table 3: STM32F303xx family device features and peripheral
counts
UpdatedSection 3.4: Embedded SRAM
Updated Section 3.2: Memory protection unit (MPU)
Updated Section 3.23: Universal serial bus (USB)
Modified Section 3.25: Touch sensing controller (TSC)
Updated heading of Table 6: USART features
Updated Table 11: STM32F303xB/STM32F303xC pin definitions
Added notes to PC13, PC14 and PC15 in Table 11:
STM32F303xB/STM32F303xC pin definitions
Updated Figure 10: Power supply scheme
Modified Table 19: Voltage characteristics
Modified Table 20: Current characteristics
Modified Table 22: General operating conditions
Modified Figure 12: Typical VBAT current consumption (LSE and RTC
ON/LSEDRV[1:0] = ’00’)
Updated Section 6.3.14: I/O port characteristics
Updated Table 28: Typical and maximum current consumption from
VDD supply at VDD = 3.6V and Table 29: Typical and maximum
current consumption from the VDDA supply
Updated Table 30: Typical and maximum VDD consumption in Stop
and Standby modes and Table 31: Typical and maximum VDDA
consumption in Stop and Standby modes
Updated Table 32: Typical and maximum current consumption from
VBAT supply
Added Figure 12: Typical VBAT current consumption (LSE and RTC
ON/LSEDRV[1:0] = ’00’)
Updated Table 33: Typical current consumption in Run mode, code
with data processing running from Flash and Table 34: Typical current
consumption in Sleep mode, code running from Flash or RAM
Added Table 36: Peripheral current consumption
Added Table 35: Switching output I/O current consumption
Updated Section 6.3.6: Wakeup time from low-power mode
Modified ESD absolute maximum ratings
Modified Table 53: Output voltage characteristics
Updated EMI characteristics
Updated Table 54: I/O AC characteristics
Updated Table 51: I/O current injection susceptibility
Updated Table 56: TIMx characteristics
Updated Section 7.2: Thermal characteristics
Added Table 67: Maximum ADC RAIN
Added Table 68: ADC accuracy - limited test conditions
Updated Table 64: ADC accuracy - limited test conditions 2)
Updated Table 70: DAC characteristics
Updated Table 72: Operational amplifier characteristics
Updated figures and tables in Section 7: Package characteristics
Table 81. Document revision history
Date Revision Changes