Datasheet

STM32F105xx, STM32F107xx Electrical characteristics
Doc ID 15274 Rev 6 75/104
Note: ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
Any positive injection current within the limits specified for I
INJ(PIN)
and ΣI
INJ(PIN)
in
Section 5.3.12 does not affect the ADC accuracy.
Table 54. ADC accuracy - limited test conditions
(1)
1. ADC DC accuracy values are measured after internal calibration.
Symbol Parameter Test conditions Typ Max
(2)
2. Based on characterization, not tested in production.
Unit
ET Total unadjusted error
f
PCLK2
= 56 MHz,
f
ADC
= 14 MHz, R
AIN
< 10 kΩ,
V
DDA
= 3 V to 3.6 V
T
A
= 25 °C
Measurements made after
ADC calibration
±1.3 ±2
LSB
EO Offset error ±1 ±1.5
EG Gain error ±0.5 ±1.5
ED Differential linearity error ±0.7 ±1
EL Integral linearity error ±0.8 ±1.5
Table 55. ADC accuracy
(1) (2)
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V
DD
, frequency and temperature ranges.
Symbol Parameter Test conditions Typ Max
(3)
3. Based on characterization, not tested in production.
Unit
ET Total unadjusted error
f
PCLK2
= 56 MHz,
f
ADC
= 14 MHz, R
AIN
< 10 kΩ,
V
DDA
= 2.4 V to 3.6 V
Measurements made after
ADC calibration
±2 ±5
LSB
EO Offset error ±1.5 ±2.5
EG Gain error ±1.5 ±3
ED Differential linearity error ±1 ±2
EL Integral linearity error ±1.5 ±3