Datasheet

DocID15056 Rev 5 33/80
STM32F102x8, STM32F102xB Electrical characteristics
79
5.3.5 Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 9: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code.
Maximum current consumption
The MCU is placed under the following conditions:
• All I/O pins are in input mode with a static value at V
DD
or V
SS
(no load)
• All peripherals are disabled except if it is explicitly mentioned
• The Flash access time is adjusted to f
HCLK
frequency (0 wait state from 0 to 24 MHz, 1
wait state from 24 to 48 MHz)
• Prefetch in on (reminder: this bit must be set before clock setting and bus prescaling)
• When the peripherals are enabled f
PCLK1
= f
HCLK/2
, f
PCLK2
= f
HCLK
The parameters given in Table 13 are derived from tests performed under ambient
temperature and V
DD
supply voltage conditions summarized in Table 8.
Table 11. Embedded internal reference voltage
Symbol Parameter Conditions Min Typ Max Unit
V
REFINT
Internal reference voltage –40 °C < T
A
< +85 °C 1.16 1.20 1.24 V
T
S_vrefint
(1)
1. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading
the internal reference voltage
5.1 17.1
(2)
2. Guaranteed by design, not tested in production.
µs
V
RERINT
(2)
Internal reference voltage spread
over the temperature range
V
DD
= 3 V ±10 mV 10 mV
T
Coeff
(2)
Temperature coefficient 100
ppm/
°C