Datasheet

Revision history STM32F102x4, STM32F102x6
76/77 DocID15057 Rev 4
24-Sep-2009 3
Note 5. updated and Note 4. added in Table 4: low-density
STM32F102xx pin definitions. Typical I
DD_VBAT
value added in Table 16:
Typical and maximum current consumptions in Stop and Standby modes.
Figure 12: Typical current consumption on V
BAT
with RTC on versus
temperature at different V
BAT
values added.
f
HSE_ext
min modified in Table 20: High-speed external user clock
characteristics.
C
L1
and C
L2
replaced by C in Table 22: HSE 4-16 MHz oscillator
characteristics and Table 23: LSE oscillator characteristics (f
LSE
= 32.768
kHz), notes modified and moved below the tables. Table 24: HSI
oscillator characteristics modified. Conditions removed from Table 26:
Low-power mode wakeup timings.
Note 1. modified below Figure 18: Typical application with an 8 MHz
crystal.
Figure 25: Recommended NRST pin protection modified.
IEC 1000 standard updated to IEC 61000 and SAE J1752/3 updated to
IEC 61967-2 in Section 5.3.10: EMC characteristics on page 46.
Jitter added to Table 27: PLL characteristics.
C
ADC
and R
AIN
parameters modified in Table 47: ADC characteristics.
R
AIN
max values modified in Ta ble 4 8: R
AIN
max for f
ADC
= 12 MHz.
02-Aug-2013 4
Figure 2: Clock tree: added FLITFCLK and Note 3., and modified Note 1..
Removed sentence in “Unless otherwise specified the parameters ...” in
I2C interface characteristics section.
Added V
IN
in Table 8: General operating conditions
Added note 5. in Table 23: HSI oscillator characteristics
Added DuCy
(HSI)
in Table 24: HSI oscillator characteristics
Table 23: LSE oscillator characteristics (f
LSE
= 32.768 kHz): removed
note 2 related to oscillator selection, updated Note 2., and t
SU(LSE
)
specified for various ambient temperature values.
Modified charge device model in Table 33: ESD absolute maximum
ratings
Updated ‘V
IL
’ and ‘V
IH
’ in Table 34: I/O static characteristics
Added notes to Figure 20: Standard I/O input characteristics - CMOS
port, Figure 21: Standard I/O input characteristics - TTL port, Figure 22:
5 V tolerant I/O input characteristics - CMOS port and Figure 23: 5 V
tolerant I/O input characteristics - TTL port
Table 37: Output voltage characteristics: updated V
OL
and V
OH
conditions for TTL and CMOS outputs and added Note 2.
Updated Figure 24: I/O AC characteristics definition
Updated Figure 25: Recommended NRST pin protection
Updated note 2. and 3. in Table 39: I2C characteristics
Updated Figure 26: I2C bus AC waveforms and measurement circuit(1)
Updated title of Table 40: SCL frequency (fPCLK1= 36 MHz, VDD_I2C =
3.3 V)
In Table 43: SPI characteristics, removed note 1 related to SPI1
remapped characteristics.
Updated Table 47: ADC characteristics
Updated Section 6.1: Package mechanical data
Table 54. Document revision history (continued)
Date Revision Changes